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In-situ monitoring of stochastic textured surfaces with EWMA scheme using dynamic KDE-based probability limits.

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Title: In-situ monitoring of stochastic textured surfaces with EWMA scheme using dynamic KDE-based probability limits.
Authors: Zhang, Suying1,2 (AUTHOR), Hu, Xuelong3 (AUTHOR), Castagliola, Philippe4 (AUTHOR), Wang, Jianjun1,2 (AUTHOR) jjwang@njust.edu.cn
Source: International Journal of Production Research. Apr2026, Vol. 64 Issue 8, p2880-2899. 20p.
Database: Business Source Ultimate
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An: 192847148
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  Data: In-situ monitoring of stochastic textured surfaces with EWMA scheme using dynamic KDE-based probability limits.
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  Data: <searchLink fieldCode="JN" term="%22International+Journal+of+Production+Research%22">International Journal of Production Research</searchLink>. Apr2026, Vol. 64 Issue 8, p2880-2899. 20p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=bsu&AN=192847148
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1080/00207543.2025.2584720
    Languages:
      – Code: eng
        Text: English
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        PageCount: 20
        StartPage: 2880
    Titles:
      – TitleFull: In-situ monitoring of stochastic textured surfaces with EWMA scheme using dynamic KDE-based probability limits.
        Type: main
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            NameFull: Zhang, Suying
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            NameFull: Hu, Xuelong
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            NameFull: Castagliola, Philippe
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            NameFull: Wang, Jianjun
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            – D: 15
              M: 04
              Text: Apr2026
              Type: published
              Y: 2026
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              Value: 64
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              Value: 8
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            – TitleFull: International Journal of Production Research
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