In-situ monitoring of stochastic textured surfaces with EWMA scheme using dynamic KDE-based probability limits.
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| Title: | In-situ monitoring of stochastic textured surfaces with EWMA scheme using dynamic KDE-based probability limits. |
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| Authors: | Zhang, Suying1,2 (AUTHOR), Hu, Xuelong3 (AUTHOR), Castagliola, Philippe4 (AUTHOR), Wang, Jianjun1,2 (AUTHOR) jjwang@njust.edu.cn |
| Source: | International Journal of Production Research. Apr2026, Vol. 64 Issue 8, p2880-2899. 20p. |
| Database: | Business Source Ultimate |
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