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Implementation of Ford 8D in Improving Efficiencies of Wafer Testers: A Case Study.

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Bibliographic Details
Title: Implementation of Ford 8D in Improving Efficiencies of Wafer Testers: A Case Study.
Authors: Chen, Ping-Shun1 (AUTHOR), Chen, Jimmy Ching-Ming2 (AUTHOR) fe8369@wayne.edu, Shen, Bao-Ming1 (AUTHOR), Chen, Gary Yu-Hsin3 (AUTHOR)
Source: Engineering Management Journal. 2026, Vol. 38 Issue 3, p217-229. 13p.
Database: Business Source Ultimate
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ISSN:10429247
DOI:10.1080/10429247.2025.2478669