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Implementation of Ford 8D in Improving Efficiencies of Wafer Testers: A Case Study.

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Title: Implementation of Ford 8D in Improving Efficiencies of Wafer Testers: A Case Study.
Authors: Chen, Ping-Shun1 (AUTHOR), Chen, Jimmy Ching-Ming2 (AUTHOR) fe8369@wayne.edu, Shen, Bao-Ming1 (AUTHOR), Chen, Gary Yu-Hsin3 (AUTHOR)
Source: Engineering Management Journal. 2026, Vol. 38 Issue 3, p217-229. 13p.
Database: Business Source Ultimate
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PubType: Academic Journal
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  Data: Implementation of Ford 8D in Improving Efficiencies of Wafer Testers: A Case Study.
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  Data: <searchLink fieldCode="JN" term="%22Engineering+Management+Journal%22">Engineering Management Journal</searchLink>. 2026, Vol. 38 Issue 3, p217-229. 13p.
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1080/10429247.2025.2478669
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      – Code: eng
        Text: English
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        PageCount: 13
        StartPage: 217
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      – TitleFull: Implementation of Ford 8D in Improving Efficiencies of Wafer Testers: A Case Study.
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            NameFull: Chen, Ping-Shun
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            NameFull: Chen, Jimmy Ching-Ming
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            NameFull: Shen, Bao-Ming
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              Text: 2026
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              Y: 2026
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              Value: 38
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