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Learning From Good Maps: A Dataset and Analysis of Layout Patterns.

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Bibliographic Details
Title: Learning From Good Maps: A Dataset and Analysis of Layout Patterns.
Authors: Yang, Nai1 (AUTHOR), Wu, Fan1 (AUTHOR), Wei, ZhiWei2,3 (AUTHOR) 2011301130108@whu.edu.cn, Wang, YiJie1 (AUTHOR)
Source: Transactions in GIS. Jun2026, Vol. 30 Issue 4, p1-20. 20p.
Database: Business Source Ultimate
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