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THE IMPACT OF CLUSTERED DEFECT DISTRIBUTIONS IN IC FABRICATION.

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Bibliographic Details
Title: THE IMPACT OF CLUSTERED DEFECT DISTRIBUTIONS IN IC FABRICATION.
Authors: Albin, Susan L.1, Friedman, David J.1
Source: Management Science (INFORMS). Sep89, Vol. 35 Issue 9, p1066-1078. 13p.
Database: Business Source Ultimate
Description
ISSN:00251909
DOI:10.1287/mnsc.35.9.1066