Simulation of digital circuit for testing
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| Title: | Simulation of digital circuit for testing |
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| Authors: | Wong, Chee Hing |
| Committee Members: | Walker, Robert L. |
| Summary: | Semiconductor technology has made significant progress in the past two decades. As a result, manufacturers are squeezing more components onto printed circuit boards, which in turn reduces testability. The cost of testing has become a major part of the cost of developing and maintaining a system. Since the early 70's, logic simulation has evolved to become the most effective means of testing digital circuit boards. This paper will cover the major aspects of digital logic simulation. The first chapter is an introduction to the subject matter. Chapter two presents the basic principles of digital testing. Chapt~r three covers the logic model elements. Chapter four discusses the rules associated with modeling and simulating faults. Chapter five considers the techniques of test pattern generation. A concluding remark assesses the future direction of digital testing. A digital logic simulation example model which includes a circuit diagram, the computer model, the stimulus/response patterns, pattern/pin-to-faultisolation- set cross reference table, a fault isolation set table, a node detection statistics table, and a fault isolation statistics table are provided in the Appendices. |
| URL: | https://stars.library.ucf.edu/rtd/4249 |
| Database: | OpenDissertations |
| Abstract: | Semiconductor technology has made significant progress in the past two decades. As a result, manufacturers are squeezing more components onto printed circuit boards, which in turn reduces testability. The cost of testing has become a major part of the cost of developing and maintaining a system. Since the early 70's, logic simulation has evolved to become the most effective means of testing digital circuit boards. This paper will cover the major aspects of digital logic simulation. The first chapter is an introduction to the subject matter. Chapter two presents the basic principles of digital testing. Chapt~r three covers the logic model elements. Chapter four discusses the rules associated with modeling and simulating faults. Chapter five considers the techniques of test pattern generation. A concluding remark assesses the future direction of digital testing. A digital logic simulation example model which includes a circuit diagram, the computer model, the stimulus/response patterns, pattern/pin-to-faultisolation- set cross reference table, a fault isolation set table, a node detection statistics table, and a fault isolation statistics table are provided in the Appendices. |
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