Bibliographic Details
| Title: |
Towards the epitaxial growth of silver on germanium by galvanic displacement. |
| Authors: |
Sayed, Sayed Youssef1 sysayed@mit.edu |
| Source: |
CrystEngComm. 2014, Vol. 16 Issue 43, p10028-10033. 6p. |
| Subjects: |
Epitaxy, Silver, Metal coating, Germanium, Electroless deposition, Transmission electron microscopes, X-ray diffraction |
| Abstract: |
This work focuses on the synthesis and interfacial characterization of silver films grown on Ge(111) surfaces. The synthetic approach uses galvanic displacement, a type of electroless deposition that takes place in an efficient manner under aqueous and room temperature conditions. The case of silver-ongermanium has been widely studied and used for several applications, and yet a number of important fundamental questions remain in order to address the nature of these interfaces. Interfacial characterization reveals no evidence for the intermetallic nature of Ag-Ge interfaces and suggests the diffusion of silver into the germanium substrate. The texture nature of the grown silver films was investigated via pole figure X-ray diffraction (XRD) and cross-section nano-beam-diffraction transmission electron microscope (TEM) analyses, indicating the epitaxial growth of silver films on germanium lattices by galvanic displacement at ambient conditions. [ABSTRACT FROM AUTHOR] |
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| Database: |
Engineering Source |
