Bibliographic Details
| Title: |
Scattering approach to scanning gate microscopy. |
| Authors: |
Jalabert, Rodolfo A.1,2, Weinmann, Dietmar1 dietmar.weinmann@ipcms.unistra.fr |
| Source: |
Physica E. Nov2015, Vol. 74, p637-643. 7p. |
| Subjects: |
Quantum conduction, Scattering potentials, Microscopy, Quantum perturbations, Quantum transitions |
| Abstract: |
We present a perturbative approach to the conductance change caused by a weakly invasive scattering potential in a two-dimensional electron gas. The resulting expressions are used to investigate the relationship between the conductance change measured in scanning gate microscopy as a function of the position of a scattering tip and local electronic quantities like the current density. We use a semiclassical approach to treat the case of a strong hard-wall scatterer in a half-plane facing a reflectionless channel. The resulting conductance change is consistent with the numerically calculated quantum conductance. [ABSTRACT FROM AUTHOR] |
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| Database: |
Engineering Source |
