Atomic Observations of Microporous Materials Highly Unstable under the Electron Beam: The Cases of Ti-Doped AlPO4-5 and Zn-MOF-74.
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| Title: | Atomic Observations of Microporous Materials Highly Unstable under the Electron Beam: The Cases of Ti-Doped AlPO |
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| Authors: | Mayoral, Alvaro1 amayoral@unizar.es, Sanchez‐Sanchez, Manuel2, Alfayate, Almudena2, Perez‐Pariente, Joaquín2, Diaz, Isabel2 |
| Source: | ChemCatChem. Nov2015, Vol. 7 Issue 22, p3719-3724. 6p. |
| Subjects: | Micrographics, Electron beams, High resolution imaging, Aluminophosphates, Atoms |
| Abstract: | This work presents the highest resolution micrographs reported so far of two beam-sensitive microporous materials: Ti-doped AlPO4-5 (TAPO-5) and the metal-organic framework Zn-MOF-74. They were registered by means of Cs-corrected STEM. The high-resolution images of the TAPO-5 along the [001] orientation allows a clear observation of the aluminophosphate-five (AFI) type framework, and illustrates the atomic distribution of the "T" atoms of the structure. However, no definitive conclusions about Ti substitution mechanism could be afforded because of the high symmetry of the AFI framework. In the case of Zn-MOF-74, the images were also obtained at 300 kV proving that under certain conditions of beam current this technique can provide invaluable information of an ever-increasing variety of molecular sieves. [ABSTRACT FROM AUTHOR] |
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| Database: | Engineering Source |
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| Abstract: | This work presents the highest resolution micrographs reported so far of two beam-sensitive microporous materials: Ti-doped AlPO4-5 (TAPO-5) and the metal-organic framework Zn-MOF-74. They were registered by means of Cs-corrected STEM. The high-resolution images of the TAPO-5 along the [001] orientation allows a clear observation of the aluminophosphate-five (AFI) type framework, and illustrates the atomic distribution of the "T" atoms of the structure. However, no definitive conclusions about Ti substitution mechanism could be afforded because of the high symmetry of the AFI framework. In the case of Zn-MOF-74, the images were also obtained at 300 kV proving that under certain conditions of beam current this technique can provide invaluable information of an ever-increasing variety of molecular sieves. [ABSTRACT FROM AUTHOR] |
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| ISSN: | 18673880 |
| DOI: | 10.1002/cctc.201500617 |
