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Design for Testability of Sleep Convention Logic.

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Title: Design for Testability of Sleep Convention Logic.
Authors: Parsan, Farhad A.1, Smith, Scott C.2, Al-Assadi, Waleed K.3
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. Feb2016, Vol. 24 Issue 2, p743-753. 11p.
Subjects: Systems on a chip, Systems on a chip testing, Logic circuits, Industrial costs, Fault tolerance (Engineering)
Abstract: Testability is a major concern in industry for today’s complex system-on-chip design. Design-for-testability (DFT) techniques are essential for any logic style, including asynchronous logic styles in order to reduce the test cost. Sleep convention logic (SCL) is a new promising asynchronous logic style that is based on the more well-known asynchronous logic style NULL convention logic (NCL). In contrast to the NCL, there are currently no design for testability methodologies existing for the SCL. The aim of this paper is to analyze the various faults within SCL pipelines and propose a scan-based DFT methodology to make the SCL testable. The proposed DFT methodology is then validated through a number of experiments, showing that the methodology provides a high test coverage (>99%). The complete DFT methodology as well as the scan chain and scan cell design are presented. [ABSTRACT FROM AUTHOR]
Copyright of IEEE Transactions on Very Large Scale Integration (VLSI) Systems is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Testability is a major concern in industry for today’s complex system-on-chip design. Design-for-testability (DFT) techniques are essential for any logic style, including asynchronous logic styles in order to reduce the test cost. Sleep convention logic (SCL) is a new promising asynchronous logic style that is based on the more well-known asynchronous logic style NULL convention logic (NCL). In contrast to the NCL, there are currently no design for testability methodologies existing for the SCL. The aim of this paper is to analyze the various faults within SCL pipelines and propose a scan-based DFT methodology to make the SCL testable. The proposed DFT methodology is then validated through a number of experiments, showing that the methodology provides a high test coverage (>99%). The complete DFT methodology as well as the scan chain and scan cell design are presented. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of IEEE Transactions on Very Large Scale Integration (VLSI) Systems is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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      – SubjectFull: Industrial costs
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      – SubjectFull: Fault tolerance (Engineering)
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      – TitleFull: Design for Testability of Sleep Convention Logic.
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              Text: Feb2016
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