Enhanced hole extraction by interaction between CuI and MoO3 in the hole transport layer of organic photovoltaic devices.

Saved in:
Bibliographic Details
Title: Enhanced hole extraction by interaction between CuI and MoO3 in the hole transport layer of organic photovoltaic devices.
Authors: Yoon, Sangcheol1, Kim, Hyebin1, Shin, Eul-Yong2, Bae, In-Gon3, Park, Byoungchoo3, Noh, Yong-Young2, Hwang, Inchan1 ihwang@kw.ac.kr
Source: Organic Electronics. May2016, Vol. 32, p200-207. 8p.
Subjects: Molybdenum oxides, Cuprous iodide, Photovoltaic cells, Methyl formate, Indium tin oxide
Abstract: The selection of materials for use of a hole transport layer is crucial to improve the photovoltaic performances by means of efficient hole extraction. Herein, we investigate how the formation of a hybrid dual hole transport interlayer consisting of copper (I) iodide (CuI) and molybdenum oxide (MoO 3 ) affects the efficiency of the device based on poly(3-hexylthiophene)(P3HT):[6,6]-phenyl-C61-butyric acid methyl ester (PCBM) blends. The rough surface of a CuI layer was observed when prepared on indium tin oxide (ITO) substrates, but became smooth by the thermal evaporation of MoO 3 on the rough CuI surface, forming a dual layer. The devices incorporated with the layer show an enhancement in efficiency compared to the devices with the CuI or MoO 3 alone layer, which is attributed to enhanced hole extraction. Our X-ray photoelectron spectroscopy (XPS) results show that Mo 5+ defect states are increased by the interaction between MoO 3 and CuI at the interface, giving rise to an increase in gap states, which we attribute to the improvement of hole extraction. [ABSTRACT FROM AUTHOR]
Copyright of Organic Electronics is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
Be the first to leave a comment!
You must be logged in first