Bibliographic Details
| Title: |
Electron beam final focus system for Thomson scattering at ELBE. |
| Authors: |
Krämer, J.M.1,2,3 jmkr@danfysik.dk, Budde, M.1, Bødker, F.1, Irman, A.2, Jochmann, A.2, Kristensen, J.P.1, Lehnert, U.2, Michel, P.2, Schramm, U.2,3 |
| Source: |
Nuclear Instruments & Methods in Physics Research Section A. Sep2016, Vol. 830, p532-535. 4p. |
| Subjects: |
Electron beams, Thomson scattering, Achromatism, Very large array telescopes, Backscattering |
| Abstract: |
The design of an electron beam final focus system (FFS) aiming for high-flux laser-Thomson backscattering X-ray sources at ELBE is presented. A telescope system consisting of four permanent magnet based quadrupoles was found to have significantly less chromatic aberrations than a quadrupole doublet or triplet as commonly used. Focusing properties like the position of the focal plane and the spot size are retained for electron beam energies between 20 and 30 MeV by adjusting the position of the quadrupoles individually on a motorized stage. The desired ultra-short electron bunches require an increased relative energy spread up to a few percent and, thus, second order chromatic effects must be taken into account. We also present the design and test results of the permanent magnet quadrupoles. Adjustable shunts allow for correction of the field strength and compensation of deviations in the permanent magnet material. For a beam emittance of 13 mm mrad, we predict focal spot sizes of about 40 μm (rms) and divergences of about 10 mrad using the FFS. [ABSTRACT FROM AUTHOR] |
|
Copyright of Nuclear Instruments & Methods in Physics Research Section A is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) |
| Database: |
Engineering Source |