APA (7th ed.) Citation

Marquez, C., Rodriguez, N., Gamiz, F., & Ohata, A. (2017). Systematic method for electrical characterization of random telegraph noise in MOSFETs. Solid-State Electronics, 128, 115. https://doi.org/10.1016/j.sse.2016.10.031

Chicago Style (17th ed.) Citation

Marquez, Carlos, Noel Rodriguez, Francisco Gamiz, and Akiko Ohata. "Systematic Method for Electrical Characterization of Random Telegraph Noise in MOSFETs." Solid-State Electronics 128 (2017): 115. https://doi.org/10.1016/j.sse.2016.10.031.

MLA (9th ed.) Citation

Marquez, Carlos, et al. "Systematic Method for Electrical Characterization of Random Telegraph Noise in MOSFETs." Solid-State Electronics, vol. 128, 2017, p. 115, https://doi.org/10.1016/j.sse.2016.10.031.