View in EDS

Taking Into Account GTEM Field Nonuniformities in Radiated Immunity Simulations Through a Simple Measurement.

Saved in:
Bibliographic Details
Title: Taking Into Account GTEM Field Nonuniformities in Radiated Immunity Simulations Through a Simple Measurement.
Authors: Land, Sjoerd Op t1, Perdriau, Richard1, Ramdani, Mohamed1
Source: IEEE Transactions on Electromagnetic Compatibility. Dec2017, Vol. 59 Issue 6, p2042-2045. 4p.
Subjects: Transverse electromagnetic cells, Immunity testing (Electronics), Electromagnetic testing, Electromagnetic compatibility, Electromagnetic interference
Abstract: When performing immunity measurements through the $\mathbf {{\text{10}}\times {\text{10}}}$ cm aperture that some gigahertz transverse electromagnetic (GTEM) cells feature, its field uniformity is generally unknown. Yet, this (non)uniformity causes an error on test results. Measuring the field uniformity by taking a grid of samples would be time-consuming. Even with such a measurement, it would be hard to predict the magnitude of this error in immunity measurement results. Therefore, another approach to the problem was taken: several imperfections of the GTEM cell were characterized simultaneously by measuring its input reflection coefficient. Then, the immunity of a device under test was simulated with the nominal GTEM field plus the first reflection. Entering this field model into the simulation corrected the major error in the 0.1–2.0 GHz range in some of our test cases, with no degradation in any case. Thanks to the speed of this method, it may be broadly applied, even only to quantify the effect of some of the GTEM's imperfections on a given immunity measurement. [ABSTRACT FROM PUBLISHER]
Copyright of IEEE Transactions on Electromagnetic Compatibility is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
Description
Abstract:When performing immunity measurements through the $\mathbf {{\text{10}}\times {\text{10}}}$ cm aperture that some gigahertz transverse electromagnetic (GTEM) cells feature, its field uniformity is generally unknown. Yet, this (non)uniformity causes an error on test results. Measuring the field uniformity by taking a grid of samples would be time-consuming. Even with such a measurement, it would be hard to predict the magnitude of this error in immunity measurement results. Therefore, another approach to the problem was taken: several imperfections of the GTEM cell were characterized simultaneously by measuring its input reflection coefficient. Then, the immunity of a device under test was simulated with the nominal GTEM field plus the first reflection. Entering this field model into the simulation corrected the major error in the 0.1–2.0 GHz range in some of our test cases, with no degradation in any case. Thanks to the speed of this method, it may be broadly applied, even only to quantify the effect of some of the GTEM's imperfections on a given immunity measurement. [ABSTRACT FROM PUBLISHER]
ISSN:00189375
DOI:10.1109/TEMC.2017.2691800