Bibliographic Details
| Title: |
In-situ electrical resistivity monitors the annealing process for Al-Mg-Mn aluminum alloy sheet. |
| Authors: |
Kao, Yih-Farn1 cssula0501@hotmail.com, Chen, Shi-Rong1, Ruan, Jrjeng2 |
| Source: |
Journal of Alloys & Compounds. Apr2018, Vol. 740, p1046-1050. 5p. |
| Subjects: |
Electrical resistivity, Annealing of metals, Aluminum alloy metallurgy, Aluminum magnesium compounds, Avrami equation |
| Abstract: |
The in-situ electrical resistivity monitors the isothermal annealing history of Al-Mg-Mn aluminum alloy sheet. The resistivity-time and the yield stress-time curves well fitted with each other helps mill engineers in optimizing both the annealing time and temperature for the mill product. The resistivity-time curves are revealed as an exponential decay and interpreted by Avrami equation with R-squared values higher than 0.98. From the extended Avrami equations, the activation energy of the recrystallization is found to be 261 kJ/mol which is a reference for the future annealing experiment. This pioneering in-situ electrical resistivity system well quantitatively correlates the resistivity with the yield stress, and therefore is a potential candidate of the commercial instrument to clarify the annealing process. [ABSTRACT FROM AUTHOR] |
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| Database: |
Engineering Source |
