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In-situ electrical resistivity monitors the annealing process for Al-Mg-Mn aluminum alloy sheet.

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Title: In-situ electrical resistivity monitors the annealing process for Al-Mg-Mn aluminum alloy sheet.
Authors: Kao, Yih-Farn1 cssula0501@hotmail.com, Chen, Shi-Rong1, Ruan, Jrjeng2
Source: Journal of Alloys & Compounds. Apr2018, Vol. 740, p1046-1050. 5p.
Subjects: Electrical resistivity, Annealing of metals, Aluminum alloy metallurgy, Aluminum magnesium compounds, Avrami equation
Abstract: The in-situ electrical resistivity monitors the isothermal annealing history of Al-Mg-Mn aluminum alloy sheet. The resistivity-time and the yield stress-time curves well fitted with each other helps mill engineers in optimizing both the annealing time and temperature for the mill product. The resistivity-time curves are revealed as an exponential decay and interpreted by Avrami equation with R-squared values higher than 0.98. From the extended Avrami equations, the activation energy of the recrystallization is found to be 261 kJ/mol which is a reference for the future annealing experiment. This pioneering in-situ electrical resistivity system well quantitatively correlates the resistivity with the yield stress, and therefore is a potential candidate of the commercial instrument to clarify the annealing process. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Alloys & Compounds is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 127982187
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: In-situ electrical resistivity monitors the annealing process for Al-Mg-Mn aluminum alloy sheet.
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  Data: <searchLink fieldCode="AR" term="%22Kao%2C+Yih-Farn%22">Kao, Yih-Farn</searchLink><relatesTo>1</relatesTo><i> cssula0501@hotmail.com</i><br /><searchLink fieldCode="AR" term="%22Chen%2C+Shi-Rong%22">Chen, Shi-Rong</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Ruan%2C+Jrjeng%22">Ruan, Jrjeng</searchLink><relatesTo>2</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Alloys+%26+Compounds%22">Journal of Alloys & Compounds</searchLink>. Apr2018, Vol. 740, p1046-1050. 5p.
– Name: Subject
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  Data: <searchLink fieldCode="DE" term="%22Electrical+resistivity%22">Electrical resistivity</searchLink><br /><searchLink fieldCode="DE" term="%22Annealing+of+metals%22">Annealing of metals</searchLink><br /><searchLink fieldCode="DE" term="%22Aluminum+alloy+metallurgy%22">Aluminum alloy metallurgy</searchLink><br /><searchLink fieldCode="DE" term="%22Aluminum+magnesium+compounds%22">Aluminum magnesium compounds</searchLink><br /><searchLink fieldCode="DE" term="%22Avrami+equation%22">Avrami equation</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: The in-situ electrical resistivity monitors the isothermal annealing history of Al-Mg-Mn aluminum alloy sheet. The resistivity-time and the yield stress-time curves well fitted with each other helps mill engineers in optimizing both the annealing time and temperature for the mill product. The resistivity-time curves are revealed as an exponential decay and interpreted by Avrami equation with R-squared values higher than 0.98. From the extended Avrami equations, the activation energy of the recrystallization is found to be 261 kJ/mol which is a reference for the future annealing experiment. This pioneering in-situ electrical resistivity system well quantitatively correlates the resistivity with the yield stress, and therefore is a potential candidate of the commercial instrument to clarify the annealing process. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Journal of Alloys & Compounds is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1016/j.jallcom.2018.01.028
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 5
        StartPage: 1046
    Subjects:
      – SubjectFull: Electrical resistivity
        Type: general
      – SubjectFull: Annealing of metals
        Type: general
      – SubjectFull: Aluminum alloy metallurgy
        Type: general
      – SubjectFull: Aluminum magnesium compounds
        Type: general
      – SubjectFull: Avrami equation
        Type: general
    Titles:
      – TitleFull: In-situ electrical resistivity monitors the annealing process for Al-Mg-Mn aluminum alloy sheet.
        Type: main
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      – PersonEntity:
          Name:
            NameFull: Kao, Yih-Farn
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            NameFull: Chen, Shi-Rong
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            NameFull: Ruan, Jrjeng
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          Dates:
            – D: 05
              M: 04
              Text: Apr2018
              Type: published
              Y: 2018
          Identifiers:
            – Type: issn-print
              Value: 09258388
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            – Type: volume
              Value: 740
          Titles:
            – TitleFull: Journal of Alloys & Compounds
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