DIAGNOSTIC TECHNIQUE SELECTION FOR SRAM LOGIC TYPE FAILURES.

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Bibliographic Details
Title:	DIAGNOSTIC TECHNIQUE SELECTION FOR SRAM LOGIC TYPE FAILURES.
Authors:	Zhigang Song¹ zhigang.song@globalfoundries.com, Safran, Laura¹
Source:	Electronic Device Failure Analysis. May2018, Vol. 20 Issue 2, p18-24. 7p.
Subjects:	Static random access memory, Static random access memory chips, Electrical engineering, Failure analysis, Digital electronics
Abstract:	The article reports that static random access memory (SRAM) is of ten chosen as the process qualification vehicle during technology development, and consequently, failure analysis of SRAM is the main feedback for process improvement and yield learning. SRAM is dense and has small features, its functionality is sensitive to process variation.
Database:	Engineering Source

Description
Abstract:	The article reports that static random access memory (SRAM) is of ten chosen as the process qualification vehicle during technology development, and consequently, failure analysis of SRAM is the main feedback for process improvement and yield learning. SRAM is dense and has small features, its functionality is sensitive to process variation.
ISSN:	15370755
DOI:	10.31399/asm.edfa.2018-2.p018