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DIAGNOSTIC TECHNIQUE SELECTION FOR SRAM LOGIC TYPE FAILURES.

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Title: DIAGNOSTIC TECHNIQUE SELECTION FOR SRAM LOGIC TYPE FAILURES.
Authors: Zhigang Song1 zhigang.song@globalfoundries.com, Safran, Laura1
Source: Electronic Device Failure Analysis. May2018, Vol. 20 Issue 2, p18-24. 7p.
Subjects: Static random access memory, Static random access memory chips, Electrical engineering, Failure analysis, Digital electronics
Abstract: The article reports that static random access memory (SRAM) is of ten chosen as the process qualification vehicle during technology development, and consequently, failure analysis of SRAM is the main feedback for process improvement and yield learning. SRAM is dense and has small features, its functionality is sensitive to process variation.
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 129248195
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PubType: Academic Journal
PubTypeId: academicJournal
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  Data: DIAGNOSTIC TECHNIQUE SELECTION FOR SRAM LOGIC TYPE FAILURES.
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  Data: <searchLink fieldCode="AR" term="%22Zhigang+Song%22">Zhigang Song</searchLink><relatesTo>1</relatesTo><i> zhigang.song@globalfoundries.com</i><br /><searchLink fieldCode="AR" term="%22Safran%2C+Laura%22">Safran, Laura</searchLink><relatesTo>1</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Electronic+Device+Failure+Analysis%22">Electronic Device Failure Analysis</searchLink>. May2018, Vol. 20 Issue 2, p18-24. 7p.
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  Data: <searchLink fieldCode="DE" term="%22Static+random+access+memory%22">Static random access memory</searchLink><br /><searchLink fieldCode="DE" term="%22Static+random+access+memory+chips%22">Static random access memory chips</searchLink><br /><searchLink fieldCode="DE" term="%22Electrical+engineering%22">Electrical engineering</searchLink><br /><searchLink fieldCode="DE" term="%22Failure+analysis%22">Failure analysis</searchLink><br /><searchLink fieldCode="DE" term="%22Digital+electronics%22">Digital electronics</searchLink>
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  Label: Abstract
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  Data: The article reports that static random access memory (SRAM) is of ten chosen as the process qualification vehicle during technology development, and consequently, failure analysis of SRAM is the main feedback for process improvement and yield learning. SRAM is dense and has small features, its functionality is sensitive to process variation.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=129248195
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.31399/asm.edfa.2018-2.p018
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      – Code: eng
        Text: English
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        PageCount: 7
        StartPage: 18
    Subjects:
      – SubjectFull: Static random access memory
        Type: general
      – SubjectFull: Static random access memory chips
        Type: general
      – SubjectFull: Electrical engineering
        Type: general
      – SubjectFull: Failure analysis
        Type: general
      – SubjectFull: Digital electronics
        Type: general
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      – TitleFull: DIAGNOSTIC TECHNIQUE SELECTION FOR SRAM LOGIC TYPE FAILURES.
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            – D: 01
              M: 05
              Text: May2018
              Type: published
              Y: 2018
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