Near-Field Scanning and Propagation of Correlated Low-Frequency Radiated Emissions.

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Bibliographic Details
Title: Near-Field Scanning and Propagation of Correlated Low-Frequency Radiated Emissions.
Authors: Gradoni, Gabriele, Ramapriya, Deepthee Madenoor, Creagh, Stephen C., Tanner, Gregor, Baharuddin, Mohd Hafiz, Nasser, Hayan, Smartt, Christopher, Thomas, David W. P.
Source: IEEE Transactions on Electromagnetic Compatibility. Dec2018, Vol. 60 Issue 6, p2045-2048. 4p.
Subjects: Electromagnetic waves, Electronic equipment, Global Positioning System, Integrated circuits, Electronic circuits, Detectors
Abstract: Electromagnetic radiation from complex printed circuit boards can occur over a broad frequency bandwidth, ranging from hundreds of megahertz to tens of gigahertz. This is becoming a critical issue for assessment of EMC and interoperability as electronic components become more and more integrated. We use emissions from an enclosure with a single-slot aperture and equipped with operating electronics to exemplify and model such sources. Spatial correlation functions obtained from two-probe measurements are used both to characterize the source and to propagate the emissions. We examine emissions in the submicrowave frequency range, where evanescent decay dominates the measured correlation function at the distances measured. We find that an approximate, diffusion-like propagator describes the measured emissions well. A phase-space approach based on Wigner functions is exploited to develop this approximation and to provide enhanced understanding of the emissions. [ABSTRACT FROM AUTHOR]
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Database: Engineering Source
Description
Abstract:Electromagnetic radiation from complex printed circuit boards can occur over a broad frequency bandwidth, ranging from hundreds of megahertz to tens of gigahertz. This is becoming a critical issue for assessment of EMC and interoperability as electronic components become more and more integrated. We use emissions from an enclosure with a single-slot aperture and equipped with operating electronics to exemplify and model such sources. Spatial correlation functions obtained from two-probe measurements are used both to characterize the source and to propagate the emissions. We examine emissions in the submicrowave frequency range, where evanescent decay dominates the measured correlation function at the distances measured. We find that an approximate, diffusion-like propagator describes the measured emissions well. A phase-space approach based on Wigner functions is exploited to develop this approximation and to provide enhanced understanding of the emissions. [ABSTRACT FROM AUTHOR]
ISSN:00189375
DOI:10.1109/TEMC.2017.2778046