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Design of compact ultrafast microscopes for single- and multi-shot imaging with MeV electrons.

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Title: Design of compact ultrafast microscopes for single- and multi-shot imaging with MeV electrons.
Authors: Wan, Weishi1, Chen, Fu-Rong2, Zhu, Yimei1,3 zhu@bnl.gov
Source: Ultramicroscopy. Nov2018, Vol. 194, p143-153. 11p.
Subjects: Electron microscopy, Scientific community, Lenses, Radio frequency, Atomic force microscopy
Abstract: Highlights • MeV electron microscopy takes advantage of strong interaction of electrons with matter while overcoming space charge problem for ultrafast microscopy. • However, MeV-electron lenses are inherently bulky and expensive, preventing them from acceptance in a broad scientific community. • We report novel design of a miniature and low-cost imaging-lens system for MeV-electrons using quadrupole multiplets both symmetric and asymmetric. • We compare its optical performance with traditional round-lenses and discuss the strategy for constructing MeV-electron microscopes. • Combining with a photocathode RF gun the MeV microscope can be fit into a small-sized laboratory for ultrafast observations and measurements. Abstract Ultrafast high-energy electron microscopy, taking advantage of strong interaction of electrons with matter while minimizing space charge problems, can be used to address a wide range of grand challenges in basics energy sciences. However, MeV-electron lenses are inherently bulky and expensive, preventing them from acceptance in a broad scientific community. In this article, we report our novel design of a compact, low-cost imaging-lens system for MeV-electrons based on quadrupole multiplets, including triplet, quadruplet and quintuplet, both symmetric and asymmetric. We compare optical performance of quadrupole-based condenser, objective and projector lenses with that of the traditional round-lenses and discuss the strategy for their practical use in constructing MeV-electron microscopes for high spatial and temporal resolution single- and multi-shot imaging. Combining the compound electron-optical system with a photocathode radiofrequency (RF) gun, such a MeV electron microscope can be fit into a small-sized laboratory for ultrafast observations and measurements. [ABSTRACT FROM AUTHOR]
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Database: Engineering Source
Description
Abstract:Highlights • MeV electron microscopy takes advantage of strong interaction of electrons with matter while overcoming space charge problem for ultrafast microscopy. • However, MeV-electron lenses are inherently bulky and expensive, preventing them from acceptance in a broad scientific community. • We report novel design of a miniature and low-cost imaging-lens system for MeV-electrons using quadrupole multiplets both symmetric and asymmetric. • We compare its optical performance with traditional round-lenses and discuss the strategy for constructing MeV-electron microscopes. • Combining with a photocathode RF gun the MeV microscope can be fit into a small-sized laboratory for ultrafast observations and measurements. Abstract Ultrafast high-energy electron microscopy, taking advantage of strong interaction of electrons with matter while minimizing space charge problems, can be used to address a wide range of grand challenges in basics energy sciences. However, MeV-electron lenses are inherently bulky and expensive, preventing them from acceptance in a broad scientific community. In this article, we report our novel design of a compact, low-cost imaging-lens system for MeV-electrons based on quadrupole multiplets, including triplet, quadruplet and quintuplet, both symmetric and asymmetric. We compare optical performance of quadrupole-based condenser, objective and projector lenses with that of the traditional round-lenses and discuss the strategy for their practical use in constructing MeV-electron microscopes for high spatial and temporal resolution single- and multi-shot imaging. Combining the compound electron-optical system with a photocathode radiofrequency (RF) gun, such a MeV electron microscope can be fit into a small-sized laboratory for ultrafast observations and measurements. [ABSTRACT FROM AUTHOR]
ISSN:03043991
DOI:10.1016/j.ultramic.2018.08.005