Design of compact ultrafast microscopes for single- and multi-shot imaging with MeV electrons.
Saved in:
| Title: | Design of compact ultrafast microscopes for single- and multi-shot imaging with MeV electrons. |
|---|---|
| Authors: | Wan, Weishi1, Chen, Fu-Rong2, Zhu, Yimei1,3 zhu@bnl.gov |
| Source: | Ultramicroscopy. Nov2018, Vol. 194, p143-153. 11p. |
| Subjects: | Electron microscopy, Scientific community, Lenses, Radio frequency, Atomic force microscopy |
| Abstract: | Highlights • MeV electron microscopy takes advantage of strong interaction of electrons with matter while overcoming space charge problem for ultrafast microscopy. • However, MeV-electron lenses are inherently bulky and expensive, preventing them from acceptance in a broad scientific community. • We report novel design of a miniature and low-cost imaging-lens system for MeV-electrons using quadrupole multiplets both symmetric and asymmetric. • We compare its optical performance with traditional round-lenses and discuss the strategy for constructing MeV-electron microscopes. • Combining with a photocathode RF gun the MeV microscope can be fit into a small-sized laboratory for ultrafast observations and measurements. Abstract Ultrafast high-energy electron microscopy, taking advantage of strong interaction of electrons with matter while minimizing space charge problems, can be used to address a wide range of grand challenges in basics energy sciences. However, MeV-electron lenses are inherently bulky and expensive, preventing them from acceptance in a broad scientific community. In this article, we report our novel design of a compact, low-cost imaging-lens system for MeV-electrons based on quadrupole multiplets, including triplet, quadruplet and quintuplet, both symmetric and asymmetric. We compare optical performance of quadrupole-based condenser, objective and projector lenses with that of the traditional round-lenses and discuss the strategy for their practical use in constructing MeV-electron microscopes for high spatial and temporal resolution single- and multi-shot imaging. Combining the compound electron-optical system with a photocathode radiofrequency (RF) gun, such a MeV electron microscope can be fit into a small-sized laboratory for ultrafast observations and measurements. [ABSTRACT FROM AUTHOR] |
| Copyright of Ultramicroscopy is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
|---|---|
| Header | DbId: egs DbLabel: Engineering Source An: 133045060 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
| IllustrationInfo | |
| Items | – Name: Title Label: Title Group: Ti Data: Design of compact ultrafast microscopes for single- and multi-shot imaging with MeV electrons. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Wan%2C+Weishi%22">Wan, Weishi</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Chen%2C+Fu-Rong%22">Chen, Fu-Rong</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Zhu%2C+Yimei%22">Zhu, Yimei</searchLink><relatesTo>1,3</relatesTo><i> zhu@bnl.gov</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Ultramicroscopy%22">Ultramicroscopy</searchLink>. Nov2018, Vol. 194, p143-153. 11p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Electron+microscopy%22">Electron microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Scientific+community%22">Scientific community</searchLink><br /><searchLink fieldCode="DE" term="%22Lenses%22">Lenses</searchLink><br /><searchLink fieldCode="DE" term="%22Radio+frequency%22">Radio frequency</searchLink><br /><searchLink fieldCode="DE" term="%22Atomic+force+microscopy%22">Atomic force microscopy</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Highlights • MeV electron microscopy takes advantage of strong interaction of electrons with matter while overcoming space charge problem for ultrafast microscopy. • However, MeV-electron lenses are inherently bulky and expensive, preventing them from acceptance in a broad scientific community. • We report novel design of a miniature and low-cost imaging-lens system for MeV-electrons using quadrupole multiplets both symmetric and asymmetric. • We compare its optical performance with traditional round-lenses and discuss the strategy for constructing MeV-electron microscopes. • Combining with a photocathode RF gun the MeV microscope can be fit into a small-sized laboratory for ultrafast observations and measurements. Abstract Ultrafast high-energy electron microscopy, taking advantage of strong interaction of electrons with matter while minimizing space charge problems, can be used to address a wide range of grand challenges in basics energy sciences. However, MeV-electron lenses are inherently bulky and expensive, preventing them from acceptance in a broad scientific community. In this article, we report our novel design of a compact, low-cost imaging-lens system for MeV-electrons based on quadrupole multiplets, including triplet, quadruplet and quintuplet, both symmetric and asymmetric. We compare optical performance of quadrupole-based condenser, objective and projector lenses with that of the traditional round-lenses and discuss the strategy for their practical use in constructing MeV-electron microscopes for high spatial and temporal resolution single- and multi-shot imaging. Combining the compound electron-optical system with a photocathode radiofrequency (RF) gun, such a MeV electron microscope can be fit into a small-sized laboratory for ultrafast observations and measurements. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Ultramicroscopy is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=133045060 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1016/j.ultramic.2018.08.005 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 11 StartPage: 143 Subjects: – SubjectFull: Electron microscopy Type: general – SubjectFull: Scientific community Type: general – SubjectFull: Lenses Type: general – SubjectFull: Radio frequency Type: general – SubjectFull: Atomic force microscopy Type: general Titles: – TitleFull: Design of compact ultrafast microscopes for single- and multi-shot imaging with MeV electrons. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Wan, Weishi – PersonEntity: Name: NameFull: Chen, Fu-Rong – PersonEntity: Name: NameFull: Zhu, Yimei IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 11 Text: Nov2018 Type: published Y: 2018 Identifiers: – Type: issn-print Value: 03043991 Numbering: – Type: volume Value: 194 Titles: – TitleFull: Ultramicroscopy Type: main |
| ResultId | 1 |
