A 130-nm Ferroelectric Nonvolatile System-on-Chip With Direct Peripheral Restore Architecture for Transient Computing System.

Saved in:
Bibliographic Details
Title: A 130-nm Ferroelectric Nonvolatile System-on-Chip With Direct Peripheral Restore Architecture for Transient Computing System.
Authors: Liu, Yongpan, Su, Fang, Yang, Yixiong, Wang, Zhibo, Wang, Yiqun, Li, Zewei, Li, Xueqing, Yoshimura, Ryuji, Naiki, Takashi, Tsuwa, Takashi, Saito, Takahiko, Wang, Zhongjun, Taniuchi, Koji, Yang, Huazhong
Source: IEEE Journal of Solid-State Circuits. Mar2019, Vol. 54 Issue 3, p885-895. 11p.
Subjects: Ferroelectric capacitors, Systems on a chip testing, Computer systems
Abstract: Owing to its unique capability to sustain computation progress over power outages, a nonvolatile processor (NVP) is promising for energy-harvesting-powered Internet-of-Things devices. However, the widespread application of NVP is continually blocked by the system integration issues and the configuration overheads of peripheral devices. This paper presents a nonvolatile system-on-chip (NVSoC) with improved integration level, power management flexibility, and system wake-up speed. An on-chip power management subsystem is designed to minimize the number of external components while supporting versatile power policies. And a direct peripheral restore architecture is outlined, which enables a fast and parallel re-configuration of peripheral devices after the resumption of power supply. A test chip is fabricated in a 130-nm ferroelectric-CMOS process with 22.09-mm2 area. Measurement results show 6 $\times $ higher data throughput as compared with a conventional NVP when facing power failures. [ABSTRACT FROM AUTHOR]
Copyright of IEEE Journal of Solid-State Circuits is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
FullText Text:
  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 134907894
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: A 130-nm Ferroelectric Nonvolatile System-on-Chip With Direct Peripheral Restore Architecture for Transient Computing System.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Liu%2C+Yongpan%22">Liu, Yongpan</searchLink><br /><searchLink fieldCode="AR" term="%22Su%2C+Fang%22">Su, Fang</searchLink><br /><searchLink fieldCode="AR" term="%22Yang%2C+Yixiong%22">Yang, Yixiong</searchLink><br /><searchLink fieldCode="AR" term="%22Wang%2C+Zhibo%22">Wang, Zhibo</searchLink><br /><searchLink fieldCode="AR" term="%22Wang%2C+Yiqun%22">Wang, Yiqun</searchLink><br /><searchLink fieldCode="AR" term="%22Li%2C+Zewei%22">Li, Zewei</searchLink><br /><searchLink fieldCode="AR" term="%22Li%2C+Xueqing%22">Li, Xueqing</searchLink><br /><searchLink fieldCode="AR" term="%22Yoshimura%2C+Ryuji%22">Yoshimura, Ryuji</searchLink><br /><searchLink fieldCode="AR" term="%22Naiki%2C+Takashi%22">Naiki, Takashi</searchLink><br /><searchLink fieldCode="AR" term="%22Tsuwa%2C+Takashi%22">Tsuwa, Takashi</searchLink><br /><searchLink fieldCode="AR" term="%22Saito%2C+Takahiko%22">Saito, Takahiko</searchLink><br /><searchLink fieldCode="AR" term="%22Wang%2C+Zhongjun%22">Wang, Zhongjun</searchLink><br /><searchLink fieldCode="AR" term="%22Taniuchi%2C+Koji%22">Taniuchi, Koji</searchLink><br /><searchLink fieldCode="AR" term="%22Yang%2C+Huazhong%22">Yang, Huazhong</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22IEEE+Journal+of+Solid-State+Circuits%22">IEEE Journal of Solid-State Circuits</searchLink>. Mar2019, Vol. 54 Issue 3, p885-895. 11p.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Ferroelectric+capacitors%22">Ferroelectric capacitors</searchLink><br /><searchLink fieldCode="DE" term="%22Systems+on+a+chip+testing%22">Systems on a chip testing</searchLink><br /><searchLink fieldCode="DE" term="%22Computer+systems%22">Computer systems</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: Owing to its unique capability to sustain computation progress over power outages, a nonvolatile processor (NVP) is promising for energy-harvesting-powered Internet-of-Things devices. However, the widespread application of NVP is continually blocked by the system integration issues and the configuration overheads of peripheral devices. This paper presents a nonvolatile system-on-chip (NVSoC) with improved integration level, power management flexibility, and system wake-up speed. An on-chip power management subsystem is designed to minimize the number of external components while supporting versatile power policies. And a direct peripheral restore architecture is outlined, which enables a fast and parallel re-configuration of peripheral devices after the resumption of power supply. A test chip is fabricated in a 130-nm ferroelectric-CMOS process with 22.09-mm2 area. Measurement results show 6 $\times $ higher data throughput as compared with a conventional NVP when facing power failures. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of IEEE Journal of Solid-State Circuits is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=134907894
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/JSSC.2018.2884349
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 11
        StartPage: 885
    Subjects:
      – SubjectFull: Ferroelectric capacitors
        Type: general
      – SubjectFull: Systems on a chip testing
        Type: general
      – SubjectFull: Computer systems
        Type: general
    Titles:
      – TitleFull: A 130-nm Ferroelectric Nonvolatile System-on-Chip With Direct Peripheral Restore Architecture for Transient Computing System.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Liu, Yongpan
      – PersonEntity:
          Name:
            NameFull: Su, Fang
      – PersonEntity:
          Name:
            NameFull: Yang, Yixiong
      – PersonEntity:
          Name:
            NameFull: Wang, Zhibo
      – PersonEntity:
          Name:
            NameFull: Wang, Yiqun
      – PersonEntity:
          Name:
            NameFull: Li, Zewei
      – PersonEntity:
          Name:
            NameFull: Li, Xueqing
      – PersonEntity:
          Name:
            NameFull: Yoshimura, Ryuji
      – PersonEntity:
          Name:
            NameFull: Naiki, Takashi
      – PersonEntity:
          Name:
            NameFull: Tsuwa, Takashi
      – PersonEntity:
          Name:
            NameFull: Saito, Takahiko
      – PersonEntity:
          Name:
            NameFull: Wang, Zhongjun
      – PersonEntity:
          Name:
            NameFull: Taniuchi, Koji
      – PersonEntity:
          Name:
            NameFull: Yang, Huazhong
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 03
              Text: Mar2019
              Type: published
              Y: 2019
          Identifiers:
            – Type: issn-print
              Value: 00189200
          Numbering:
            – Type: volume
              Value: 54
            – Type: issue
              Value: 3
          Titles:
            – TitleFull: IEEE Journal of Solid-State Circuits
              Type: main
ResultId 1