SECS-GEM for Y2K testing in fabs.

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Bibliographic Details
Title: SECS-GEM for Y2K testing in fabs.
Authors: Ghiselli, Jack, Saso, Chris
Source: Solid State Technology. Dec98, Vol. 41 Issue 12, p71. 4p.
Subjects: Year 2000 date conversion (Computer systems), Semiconductor industry, Economics
Abstract: Discusses the implication of the year 2000 (Y2K) computer problem to the semiconductor industry, particularly in wafer fabrication capital management software. Actions taken by suppliers in preparation for the Y2K problem; Testing for Y2K readiness or compliance; Fixing the problem. INSET: The legal side of Y2K readiness.
Database: Engineering Source
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Abstract:Discusses the implication of the year 2000 (Y2K) computer problem to the semiconductor industry, particularly in wafer fabrication capital management software. Actions taken by suppliers in preparation for the Y2K problem; Testing for Y2K readiness or compliance; Fixing the problem. INSET: The legal side of Y2K readiness.
ISSN:0038111X