Fast ROM Macrocells for ASICs.

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Bibliographic Details
Title: Fast ROM Macrocells for ASICs.
Authors: Shibata, Nobutaro1
Source: Electronics & Communications in Japan, Part 2: Electronics. May96, Vol. 79 Issue 5, p77-87. 11p.
Subjects: Read-only memory, Computer storage devices, Application-specific integrated circuits, Integrated circuits, Logic circuits, Digital electronics, Electronics
Abstract: SRAMs and ROMs are installed on high-performance ASICs as the memory macrocells. This paper discusses the design of mask ROMs as the macrocells from the viewpoint of the high-speed and low-power dissipation. NOR-type memory cell array configuration is adopted, and the memory content is set using the LSI mask for contact process. A memory cell programming method is proposed where the source of the MOS transistor and the GND line are connected or disconnected according to the memory content. In this method, the adjacent cells can share the contact area to a bit-line. This helps to reduce the p-n junction capacitance, which dominates the parasitic capacitance of the bit-line, to be halved. Using a reference voltage generator, the bit-line is controlled close to GND level, which improves the detection sensitivity of the current-mirror sense amplifiers. The small-amplitude operation of the bit-lines is realized and the access time is reduced. As a technique to reduce the power dissipation, the virtual GND lines are introduced, which are controlled by the column address signals. The lines are controlled to the floating state in the stand-by mode so that the dynamic power dissipation is reduced. A test chip was designed and fabricated by a 0.5-μm CMOS process, and the address access time of 7.2 ns was obtained for the 4-K word x 4-bit organization. [ABSTRACT FROM AUTHOR]
Copyright of Electronics & Communications in Japan, Part 2: Electronics is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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DbLabel: Engineering Source
An: 14084135
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  Data: Fast ROM Macrocells for ASICs.
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  Data: <searchLink fieldCode="JN" term="%22Electronics+%26+Communications+in+Japan%2C+Part+2%3A+Electronics%22">Electronics & Communications in Japan, Part 2: Electronics</searchLink>. May96, Vol. 79 Issue 5, p77-87. 11p.
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  Data: <searchLink fieldCode="DE" term="%22Read-only+memory%22">Read-only memory</searchLink><br /><searchLink fieldCode="DE" term="%22Computer+storage+devices%22">Computer storage devices</searchLink><br /><searchLink fieldCode="DE" term="%22Application-specific+integrated+circuits%22">Application-specific integrated circuits</searchLink><br /><searchLink fieldCode="DE" term="%22Integrated+circuits%22">Integrated circuits</searchLink><br /><searchLink fieldCode="DE" term="%22Logic+circuits%22">Logic circuits</searchLink><br /><searchLink fieldCode="DE" term="%22Digital+electronics%22">Digital electronics</searchLink><br /><searchLink fieldCode="DE" term="%22Electronics%22">Electronics</searchLink>
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  Data: SRAMs and ROMs are installed on high-performance ASICs as the memory macrocells. This paper discusses the design of mask ROMs as the macrocells from the viewpoint of the high-speed and low-power dissipation. NOR-type memory cell array configuration is adopted, and the memory content is set using the LSI mask for contact process. A memory cell programming method is proposed where the source of the MOS transistor and the GND line are connected or disconnected according to the memory content. In this method, the adjacent cells can share the contact area to a bit-line. This helps to reduce the p-n junction capacitance, which dominates the parasitic capacitance of the bit-line, to be halved. Using a reference voltage generator, the bit-line is controlled close to GND level, which improves the detection sensitivity of the current-mirror sense amplifiers. The small-amplitude operation of the bit-lines is realized and the access time is reduced. As a technique to reduce the power dissipation, the virtual GND lines are introduced, which are controlled by the column address signals. The lines are controlled to the floating state in the stand-by mode so that the dynamic power dissipation is reduced. A test chip was designed and fabricated by a 0.5-μm CMOS process, and the address access time of 7.2 ns was obtained for the 4-K word x 4-bit organization. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Electronics & Communications in Japan, Part 2: Electronics is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1002/ecjb.4420790508
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      – Code: eng
        Text: English
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        PageCount: 11
        StartPage: 77
    Subjects:
      – SubjectFull: Read-only memory
        Type: general
      – SubjectFull: Computer storage devices
        Type: general
      – SubjectFull: Application-specific integrated circuits
        Type: general
      – SubjectFull: Integrated circuits
        Type: general
      – SubjectFull: Logic circuits
        Type: general
      – SubjectFull: Digital electronics
        Type: general
      – SubjectFull: Electronics
        Type: general
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      – TitleFull: Fast ROM Macrocells for ASICs.
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            NameFull: Shibata, Nobutaro
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              M: 05
              Text: May96
              Type: published
              Y: 1996
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              Value: 79
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            – TitleFull: Electronics & Communications in Japan, Part 2: Electronics
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