View in EDS

RandShift: An Energy-Efficient Fault-Tolerant Method in Secure Nonvolatile Main Memory.

Saved in:
Bibliographic Details
Title: RandShift: An Energy-Efficient Fault-Tolerant Method in Secure Nonvolatile Main Memory.
Authors: Soltani, Morteza1 (AUTHOR) morteza.soltani@ut.ac.ir, Kamal, Mehdi1 (AUTHOR) mehdikamal@ut.ac.ir, Afzali-Kusha, Ali1 (AUTHOR) afzali@ut.ac.ir, Pedram, Massoud2 (AUTHOR) pedram@usc.edu
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. Jan2020, Vol. 28 Issue 1, p287-291. 5p.
Subjects: Nonvolatile memory, Advanced Encryption Standard, Bit error rate, Cryptography, Random access memory, Error correction (Information theory), Fault location (Engineering), Error rates
Abstract: In this article, we present a simple, yet energy- and area-efficient method for tolerating the stuck-at faults caused by an endurance issue in secure-resistive main memories. In the proposed method, by employing the random characteristics of the encrypted data encoded by the Advanced Encryption Standard (AES) as well as a rotational shift operation, a large number of memory locations with stuck-at faults could be employed for correctly storing the data. Due to the simple hardware implementation of the proposed method, its energy consumption is considerably smaller than that of other recently proposed methods. The technique may be employed along with other error correction methods, including the error correction code (ECC) and the error correction pointer (ECP). To assess the efficacy of the proposed method, it is implemented in a phase-change memory (PCM)-based main memory system and compared with three error tolerating methods. The results reveal that for a stuck-at fault occurrence rate of 10−2 and with the uncorrected bit error rate of ${2 \times 10}^{-3}$ , the proposed method achieves 82% energy reduction compared to the state-of-the-art method. More generally, using a simulation analysis technique, we show that the fault coverage of the proposed method is similar to that of the state-of-the-art method. [ABSTRACT FROM AUTHOR]
Copyright of IEEE Transactions on Very Large Scale Integration (VLSI) Systems is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
FullText Text:
  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 141081697
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: RandShift: An Energy-Efficient Fault-Tolerant Method in Secure Nonvolatile Main Memory.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Soltani%2C+Morteza%22">Soltani, Morteza</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> morteza.soltani@ut.ac.ir</i><br /><searchLink fieldCode="AR" term="%22Kamal%2C+Mehdi%22">Kamal, Mehdi</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> mehdikamal@ut.ac.ir</i><br /><searchLink fieldCode="AR" term="%22Afzali-Kusha%2C+Ali%22">Afzali-Kusha, Ali</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> afzali@ut.ac.ir</i><br /><searchLink fieldCode="AR" term="%22Pedram%2C+Massoud%22">Pedram, Massoud</searchLink><relatesTo>2</relatesTo> (AUTHOR)<i> pedram@usc.edu</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Very+Large+Scale+Integration+%28VLSI%29+Systems%22">IEEE Transactions on Very Large Scale Integration (VLSI) Systems</searchLink>. Jan2020, Vol. 28 Issue 1, p287-291. 5p.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Nonvolatile+memory%22">Nonvolatile memory</searchLink><br /><searchLink fieldCode="DE" term="%22Advanced+Encryption+Standard%22">Advanced Encryption Standard</searchLink><br /><searchLink fieldCode="DE" term="%22Bit+error+rate%22">Bit error rate</searchLink><br /><searchLink fieldCode="DE" term="%22Cryptography%22">Cryptography</searchLink><br /><searchLink fieldCode="DE" term="%22Random+access+memory%22">Random access memory</searchLink><br /><searchLink fieldCode="DE" term="%22Error+correction+%28Information+theory%29%22">Error correction (Information theory)</searchLink><br /><searchLink fieldCode="DE" term="%22Fault+location+%28Engineering%29%22">Fault location (Engineering)</searchLink><br /><searchLink fieldCode="DE" term="%22Error+rates%22">Error rates</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: In this article, we present a simple, yet energy- and area-efficient method for tolerating the stuck-at faults caused by an endurance issue in secure-resistive main memories. In the proposed method, by employing the random characteristics of the encrypted data encoded by the Advanced Encryption Standard (AES) as well as a rotational shift operation, a large number of memory locations with stuck-at faults could be employed for correctly storing the data. Due to the simple hardware implementation of the proposed method, its energy consumption is considerably smaller than that of other recently proposed methods. The technique may be employed along with other error correction methods, including the error correction code (ECC) and the error correction pointer (ECP). To assess the efficacy of the proposed method, it is implemented in a phase-change memory (PCM)-based main memory system and compared with three error tolerating methods. The results reveal that for a stuck-at fault occurrence rate of 10−2 and with the uncorrected bit error rate of ${2 \times 10}^{-3}$ , the proposed method achieves 82% energy reduction compared to the state-of-the-art method. More generally, using a simulation analysis technique, we show that the fault coverage of the proposed method is similar to that of the state-of-the-art method. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of IEEE Transactions on Very Large Scale Integration (VLSI) Systems is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=141081697
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/TVLSI.2019.2943073
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 5
        StartPage: 287
    Subjects:
      – SubjectFull: Nonvolatile memory
        Type: general
      – SubjectFull: Advanced Encryption Standard
        Type: general
      – SubjectFull: Bit error rate
        Type: general
      – SubjectFull: Cryptography
        Type: general
      – SubjectFull: Random access memory
        Type: general
      – SubjectFull: Error correction (Information theory)
        Type: general
      – SubjectFull: Fault location (Engineering)
        Type: general
      – SubjectFull: Error rates
        Type: general
    Titles:
      – TitleFull: RandShift: An Energy-Efficient Fault-Tolerant Method in Secure Nonvolatile Main Memory.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Soltani, Morteza
      – PersonEntity:
          Name:
            NameFull: Kamal, Mehdi
      – PersonEntity:
          Name:
            NameFull: Afzali-Kusha, Ali
      – PersonEntity:
          Name:
            NameFull: Pedram, Massoud
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 01
              Text: Jan2020
              Type: published
              Y: 2020
          Identifiers:
            – Type: issn-print
              Value: 10638210
          Numbering:
            – Type: volume
              Value: 28
            – Type: issue
              Value: 1
          Titles:
            – TitleFull: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
              Type: main
ResultId 1