Bibliographic Details
| Title: |
ESREF 2019 IN TOULOUSE. |
| Authors: |
Nolhier, Nicolas1 nicolas.nolhier@laas.fr, Bascoul, Guillaume1 guillaume.bascoul@cnes.fr |
| Source: |
Electronic Device Failure Analysis. May2020, Vol. 22 Issue 2, p26-30. 5p. |
| Subjects: |
Failure Analysis System (Computer system), Failure analysis, Materials management |
| Geographic Terms: |
Toulouse (France) |
| Abstract: |
The article offers information on the 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2019) that was held in Toulouse, France from September 23-26, 2019. Topics discussed include the Technical Program Committee (TPC), space and aeronautic systems; and layered dielectrics in solid-state microelectronic devices by Mario Lanza. |
| Database: |
Engineering Source |
