WAFER-SCALE INTEGRATION.

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Bibliographic Details
Title:	WAFER-SCALE INTEGRATION.
Authors:	Razzaghi, Mohsen¹, Nazabzadeh, Jalal²
Source:	Encyclopedia of Electrical & Electronics Engineering. 1999 1st Edition, Vol. 23, p413-429. 17p.
Subjects:	Wafer-scale integration of circuits, Systolic array circuits, Microelectronics, Reduced instruction set computers, Semiconductors, Digital electronics
Abstract:	This article discusses the significance of wafer-scale integration. Silicon digital integrated circuits (IC) are manufactured as small rectangular circuits on large-area silicon substrates. The normal maximum area of a functional IC is limited by the non-vanishing density of defects introduced during the manufacture of an integrated circuit. The shaded squares represent ICs which are defective because of the defects. If the area of the individual ICs within this full wafer of circuitry is very small, then the probability that a defect appears in any given IC is small, leading to only a few ICs with a microscopic defect damaging the circuitry.
Database:	Engineering Source

Description
Abstract:	This article discusses the significance of wafer-scale integration. Silicon digital integrated circuits (IC) are manufactured as small rectangular circuits on large-area silicon substrates. The normal maximum area of a functional IC is limited by the non-vanishing density of defects introduced during the manufacture of an integrated circuit. The shaded squares represent ICs which are defective because of the defects. If the area of the individual ICs within this full wafer of circuitry is very small, then the probability that a defect appears in any given IC is small, leading to only a few ICs with a microscopic defect damaging the circuitry.