Bibliographic Details
| Title: |
Microbeam grazing incidence small angle X-ray scattering—a new method to investigate heterogeneous thin films and multilayers |
| Authors: |
Roth, S.V. sroth@esrf.fr, Müller-Buschbaum, P.1, Burghammer, M.2, Walter, H.3, Panagiotou, P.1, Diethert, A.1, Riekel, C.2 |
| Source: |
Spectrochimica Acta Part B. Oct2004, Vol. 59 Issue 10/11, p1765-1773. 9p. |
| Subjects: |
X-ray scattering, Microscopy, Thin films, Optics |
| Abstract: |
The combination of the ID13/ESRF micrometer-sized X-ray beam with the reflection geometry allowed to establish a new scattering method for investigating laterally patterned heterogeneous multilayers and interfaces. This new method—called microbeam grazing incidence small angle X-ray scattering (μGISAXS)—has been applied to a novel gradient multilayer of self-assembled nanometer-sized noble metal clusters on top of a polymer layer, being of significant importance for many technological applications, including biorecognitive sensoring. The new feature of using a 5 μm X-ray beam allows to characterize laterally heterogeneous samples on two length scales, induced by the small beamsize and reciprocal space resolution. From the two-dimensional μGISAXS patterns the three-dimensional structure and morphology of the gradient of gold (Au) clusters was reconstructed using detailed model simulations. Though being a highly complex sample, it turned out that the gradient is characterized by a single parameter, namely the cluster height. Atomic force microscopy (AFM) and optical absorption spectra provide supplementary information and help to enlighten the structure of evaporated gold clusters on polymer layers. [Copyright &y& Elsevier] |
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| Database: |
Engineering Source |