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Microbeam grazing incidence small angle X-ray scattering—a new method to investigate heterogeneous thin films and multilayers

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Title: Microbeam grazing incidence small angle X-ray scattering—a new method to investigate heterogeneous thin films and multilayers
Authors: Roth, S.V. sroth@esrf.fr, Müller-Buschbaum, P.1, Burghammer, M.2, Walter, H.3, Panagiotou, P.1, Diethert, A.1, Riekel, C.2
Source: Spectrochimica Acta Part B. Oct2004, Vol. 59 Issue 10/11, p1765-1773. 9p.
Subjects: X-ray scattering, Microscopy, Thin films, Optics
Abstract: The combination of the ID13/ESRF micrometer-sized X-ray beam with the reflection geometry allowed to establish a new scattering method for investigating laterally patterned heterogeneous multilayers and interfaces. This new method—called microbeam grazing incidence small angle X-ray scattering (μGISAXS)—has been applied to a novel gradient multilayer of self-assembled nanometer-sized noble metal clusters on top of a polymer layer, being of significant importance for many technological applications, including biorecognitive sensoring. The new feature of using a 5 μm X-ray beam allows to characterize laterally heterogeneous samples on two length scales, induced by the small beamsize and reciprocal space resolution. From the two-dimensional μGISAXS patterns the three-dimensional structure and morphology of the gradient of gold (Au) clusters was reconstructed using detailed model simulations. Though being a highly complex sample, it turned out that the gradient is characterized by a single parameter, namely the cluster height. Atomic force microscopy (AFM) and optical absorption spectra provide supplementary information and help to enlighten the structure of evaporated gold clusters on polymer layers. [Copyright &y& Elsevier]
Copyright of Spectrochimica Acta Part B is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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DbLabel: Engineering Source
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PubType: Academic Journal
PubTypeId: academicJournal
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  Data: <searchLink fieldCode="JN" term="%22Spectrochimica+Acta+Part+B%22">Spectrochimica Acta Part B</searchLink>. Oct2004, Vol. 59 Issue 10/11, p1765-1773. 9p.
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  Data: The combination of the ID13/ESRF micrometer-sized X-ray beam with the reflection geometry allowed to establish a new scattering method for investigating laterally patterned heterogeneous multilayers and interfaces. This new method—called microbeam grazing incidence small angle X-ray scattering (μGISAXS)—has been applied to a novel gradient multilayer of self-assembled nanometer-sized noble metal clusters on top of a polymer layer, being of significant importance for many technological applications, including biorecognitive sensoring. The new feature of using a 5 μm X-ray beam allows to characterize laterally heterogeneous samples on two length scales, induced by the small beamsize and reciprocal space resolution. From the two-dimensional μGISAXS patterns the three-dimensional structure and morphology of the gradient of gold (Au) clusters was reconstructed using detailed model simulations. Though being a highly complex sample, it turned out that the gradient is characterized by a single parameter, namely the cluster height. Atomic force microscopy (AFM) and optical absorption spectra provide supplementary information and help to enlighten the structure of evaporated gold clusters on polymer layers. [Copyright &y& Elsevier]
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  Data: <i>Copyright of Spectrochimica Acta Part B is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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      – SubjectFull: Thin films
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              Text: Oct2004
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