Bibliographic Details
| Title: |
Comparative analysis of nanostructured diblock copolymer films |
| Authors: |
Müller-Buschbaum, P. muellerb@ph.tum.de, Hermsdorf, N.1, Roth, S.V.2, Wiedersich, J.3, Cunis, S.4, Gehrke, R.4 |
| Source: |
Spectrochimica Acta Part B. Oct2004, Vol. 59 Issue 10/11, p1789-1797. 9p. |
| Subjects: |
Polymers, X-ray scattering, Macromolecules, Thin films |
| Abstract: |
Nanostructured polymer films of poly(styrene-block-paramethylstyrene) diblock copolymers P(Sd-b-pMS) on silicon substrates with a native oxide layer are investigated. Resulting from a storage under toluene vapor, a surface structure is installed. The early stages, characterized by the creation of a host structure out of an initially continuous film, are addressed. Grazing incidence small-angle X-ray scattering (GISAXS) experiments were performed as a function of exposure time. Results are compared to modelling of the scattering pattern and other experimental techniques, such as grazing incidence small-angle neutron scattering (GISANS) and atomic force microscopy (AFM) data. Possibilities and limits of the techniques are discussed. [Copyright &y& Elsevier] |
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| Database: |
Engineering Source |
