Comparative analysis of nanostructured diblock copolymer films

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Title: Comparative analysis of nanostructured diblock copolymer films
Authors: Müller-Buschbaum, P. muellerb@ph.tum.de, Hermsdorf, N.1, Roth, S.V.2, Wiedersich, J.3, Cunis, S.4, Gehrke, R.4
Source: Spectrochimica Acta Part B. Oct2004, Vol. 59 Issue 10/11, p1789-1797. 9p.
Subjects: Polymers, X-ray scattering, Macromolecules, Thin films
Abstract: Nanostructured polymer films of poly(styrene-block-paramethylstyrene) diblock copolymers P(Sd-b-pMS) on silicon substrates with a native oxide layer are investigated. Resulting from a storage under toluene vapor, a surface structure is installed. The early stages, characterized by the creation of a host structure out of an initially continuous film, are addressed. Grazing incidence small-angle X-ray scattering (GISAXS) experiments were performed as a function of exposure time. Results are compared to modelling of the scattering pattern and other experimental techniques, such as grazing incidence small-angle neutron scattering (GISANS) and atomic force microscopy (AFM) data. Possibilities and limits of the techniques are discussed. [Copyright &y& Elsevier]
Copyright of Spectrochimica Acta Part B is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Comparative analysis of nanostructured diblock copolymer films
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  Data: <searchLink fieldCode="AR" term="%22Müller-Buschbaum%2C+P%2E%22">Müller-Buschbaum, P.</searchLink><i> muellerb@ph.tum.de</i><br /><searchLink fieldCode="AR" term="%22Hermsdorf%2C+N%2E%22">Hermsdorf, N.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Roth%2C+S%2EV%2E%22">Roth, S.V.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Wiedersich%2C+J%2E%22">Wiedersich, J.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Cunis%2C+S%2E%22">Cunis, S.</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AR" term="%22Gehrke%2C+R%2E%22">Gehrke, R.</searchLink><relatesTo>4</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Spectrochimica+Acta+Part+B%22">Spectrochimica Acta Part B</searchLink>. Oct2004, Vol. 59 Issue 10/11, p1789-1797. 9p.
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  Data: <searchLink fieldCode="DE" term="%22Polymers%22">Polymers</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+scattering%22">X-ray scattering</searchLink><br /><searchLink fieldCode="DE" term="%22Macromolecules%22">Macromolecules</searchLink><br /><searchLink fieldCode="DE" term="%22Thin+films%22">Thin films</searchLink>
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  Data: Nanostructured polymer films of poly(styrene-block-paramethylstyrene) diblock copolymers P(Sd-b-pMS) on silicon substrates with a native oxide layer are investigated. Resulting from a storage under toluene vapor, a surface structure is installed. The early stages, characterized by the creation of a host structure out of an initially continuous film, are addressed. Grazing incidence small-angle X-ray scattering (GISAXS) experiments were performed as a function of exposure time. Results are compared to modelling of the scattering pattern and other experimental techniques, such as grazing incidence small-angle neutron scattering (GISANS) and atomic force microscopy (AFM) data. Possibilities and limits of the techniques are discussed. [Copyright &y& Elsevier]
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  Data: <i>Copyright of Spectrochimica Acta Part B is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1016/j.sab.2004.07.019
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              Text: Oct2004
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