Bibliographic Details
| Title: |
Versatile, rapid and robust nano-positioning of single-photon emitters by AFM-nanoxerography. |
| Authors: |
Humbert, M1,2 (AUTHOR), Hallez, Y3 (AUTHOR), Larrey, V4 (AUTHOR), Fournel, F4 (AUTHOR), Palleau, E1 (AUTHOR), Paillard, V2 (AUTHOR), Cuche, A2 (AUTHOR), Ressier, L1 (AUTHOR) laurence.ressier@insa-toulouse.fr |
| Source: |
Nanotechnology. 5/21/2022, Vol. 33 Issue 21, p1-9. 9p. |
| Subjects: |
Atomic force microscopy, Surface potential, Nanodiamonds |
| Abstract: |
Atomic force microscopy (AFM) nanoxerography was successfully used to direct the assembly of colloidal nanodiamonds (NDs) containing nitrogen-vacancy (NV) centres on electrostatically patterned surfaces. This study reveals that the number of deposited NDs can be controlled by tuning the surface potentials of positively charged dots on a negatively charged background written by AFM in a thin PMMA electret film, yielding assemblies down to a unique single-photon emitter with very good selectivity. The mechanisms of the ND directed assembly are attested by numerical simulations. This robust deterministic nano-positioning of quantum emitters thus offers great opportunities for ultimate applications in nanophotonics for quantum technologies. [ABSTRACT FROM AUTHOR] |
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| Database: |
Engineering Source |
