Study on ferroelectric polarization induced resistive switching characteristics of neodymium-doped bismuth ferrite thin films for random access memory applications.

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Bibliographic Details
Title: Study on ferroelectric polarization induced resistive switching characteristics of neodymium-doped bismuth ferrite thin films for random access memory applications.
Authors: Kossar, Shahnaz1 (AUTHOR), Amiruddin, R.1 (AUTHOR) amir@crescent.education, Rasool, Asif1 (AUTHOR), Kumar, M.C. Santhosh2 (AUTHOR), Katragadda, Nagamalleswari3 (AUTHOR), Mandal, Pranab3 (AUTHOR), Ahmed, Nafis4 (AUTHOR)
Source: Current Applied Physics. Jul2022, Vol. 39, p221-229. 9p.
Database: Engineering Source
Description
ISSN:15671739
DOI:10.1016/j.cap.2022.04.013