ZnS stacking order influence on the formation of Zn-poor and Zn-rich Cu2ZnSnS4 phase.
Saved in:
| Title: | ZnS stacking order influence on the formation of Zn-poor and Zn-rich Cu |
|---|---|
| Authors: | Zaki, Mohamed Yassine1 (AUTHOR) yassine.zaki@infim.ro, El Khouja, Outman1,2 (AUTHOR), Nouneh, Khalid2 (AUTHOR), Ebn Touhami, Mohamed2 (AUTHOR), Matei, Elena1 (AUTHOR), Azmi, Sara3 (AUTHOR), Rusu, Madalin Ion4 (AUTHOR), Grigorescu, Cristiana Eugenia Ana4 (AUTHOR), Briche, Samir5 (AUTHOR), Boutamart, Mustapha5 (AUTHOR), Badica, Petre1 (AUTHOR), Burdusel, Mihail1 (AUTHOR), Secu, Mihail1 (AUTHOR), Pintilie, Lucian1 (AUTHOR), Galca, Aurelian Catalin1 (AUTHOR) |
| Source: | Journal of Materials Science: Materials in Electronics. May2022, Vol. 33 Issue 15, p11989-12001. 13p. |
| Subjects: | Zinc sulfide, Scanning electron microscopes, Buffer layers, Surface morphology, Kesterite, X-ray diffraction |
| Abstract: | This paper reports the synthesis and characterization of Cu2ZnSnS4 (CZTS) absorber films, prepared by a two-step electrodeposition of a ZnS (zinc sulfide) binary and a CZT (copper, zinc and tin) ternary precursors on Mo/Ti/Si substrates. The as-electrodeposited ZnS/CZT and CZT/ZnS stacks were thermally treated in a tubular furnace in sulfur environment at 550 °C. The role of the ZnS buffer layer is to provide a zinc and sulfur reservoir, needed to complete the formation of kesterite phase. X-ray diffraction and Raman analyses revealed the formation of the CZTS phase. The surface morphology and chemical composition of the films were studied using a scanning electron microscope. The bandgap values inferred from diffuse reflectance data, are discussed with respect to the stoichiometry which is considerably affected by the order of the stacks. Room-temperature photoluminescence of the CZT/ZnS sample showed a board PL band of 1.51 eV. It was found that the film with a ZnS layer on top is preferred for the formation of a Zn-rich single CZTS phase. [ABSTRACT FROM AUTHOR] |
| Copyright of Journal of Materials Science: Materials in Electronics is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
|
Full text is not displayed to guests.
Login for full access.
|
|
| FullText | Links: – Type: pdflink Text: Availability: 1 |
|---|---|
| Header | DbId: egs DbLabel: Engineering Source An: 158366482 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
| IllustrationInfo | |
| Items | – Name: Title Label: Title Group: Ti Data: ZnS stacking order influence on the formation of Zn-poor and Zn-rich Cu<subscript>2</subscript>ZnSnS<subscript>4</subscript> phase. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Zaki%2C+Mohamed+Yassine%22">Zaki, Mohamed Yassine</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> yassine.zaki@infim.ro</i><br /><searchLink fieldCode="AR" term="%22El+Khouja%2C+Outman%22">El Khouja, Outman</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Nouneh%2C+Khalid%22">Nouneh, Khalid</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Ebn+Touhami%2C+Mohamed%22">Ebn Touhami, Mohamed</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Matei%2C+Elena%22">Matei, Elena</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Azmi%2C+Sara%22">Azmi, Sara</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Rusu%2C+Madalin+Ion%22">Rusu, Madalin Ion</searchLink><relatesTo>4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Grigorescu%2C+Cristiana+Eugenia+Ana%22">Grigorescu, Cristiana Eugenia Ana</searchLink><relatesTo>4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Briche%2C+Samir%22">Briche, Samir</searchLink><relatesTo>5</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Boutamart%2C+Mustapha%22">Boutamart, Mustapha</searchLink><relatesTo>5</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Badica%2C+Petre%22">Badica, Petre</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Burdusel%2C+Mihail%22">Burdusel, Mihail</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Secu%2C+Mihail%22">Secu, Mihail</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Pintilie%2C+Lucian%22">Pintilie, Lucian</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Galca%2C+Aurelian+Catalin%22">Galca, Aurelian Catalin</searchLink><relatesTo>1</relatesTo> (AUTHOR) – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>. May2022, Vol. 33 Issue 15, p11989-12001. 13p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Zinc+sulfide%22">Zinc sulfide</searchLink><br /><searchLink fieldCode="DE" term="%22Scanning+electron+microscopes%22">Scanning electron microscopes</searchLink><br /><searchLink fieldCode="DE" term="%22Buffer+layers%22">Buffer layers</searchLink><br /><searchLink fieldCode="DE" term="%22Surface+morphology%22">Surface morphology</searchLink><br /><searchLink fieldCode="DE" term="%22Kesterite%22">Kesterite</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+diffraction%22">X-ray diffraction</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: This paper reports the synthesis and characterization of Cu2ZnSnS4 (CZTS) absorber films, prepared by a two-step electrodeposition of a ZnS (zinc sulfide) binary and a CZT (copper, zinc and tin) ternary precursors on Mo/Ti/Si substrates. The as-electrodeposited ZnS/CZT and CZT/ZnS stacks were thermally treated in a tubular furnace in sulfur environment at 550 °C. The role of the ZnS buffer layer is to provide a zinc and sulfur reservoir, needed to complete the formation of kesterite phase. X-ray diffraction and Raman analyses revealed the formation of the CZTS phase. The surface morphology and chemical composition of the films were studied using a scanning electron microscope. The bandgap values inferred from diffuse reflectance data, are discussed with respect to the stoichiometry which is considerably affected by the order of the stacks. Room-temperature photoluminescence of the CZT/ZnS sample showed a board PL band of 1.51 eV. It was found that the film with a ZnS layer on top is preferred for the formation of a Zn-rich single CZTS phase. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Journal of Materials Science: Materials in Electronics is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=158366482 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s10854-022-08160-6 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 13 StartPage: 11989 Subjects: – SubjectFull: Zinc sulfide Type: general – SubjectFull: Scanning electron microscopes Type: general – SubjectFull: Buffer layers Type: general – SubjectFull: Surface morphology Type: general – SubjectFull: Kesterite Type: general – SubjectFull: X-ray diffraction Type: general Titles: – TitleFull: ZnS stacking order influence on the formation of Zn-poor and Zn-rich Cu2ZnSnS4 phase. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Zaki, Mohamed Yassine – PersonEntity: Name: NameFull: El Khouja, Outman – PersonEntity: Name: NameFull: Nouneh, Khalid – PersonEntity: Name: NameFull: Ebn Touhami, Mohamed – PersonEntity: Name: NameFull: Matei, Elena – PersonEntity: Name: NameFull: Azmi, Sara – PersonEntity: Name: NameFull: Rusu, Madalin Ion – PersonEntity: Name: NameFull: Grigorescu, Cristiana Eugenia Ana – PersonEntity: Name: NameFull: Briche, Samir – PersonEntity: Name: NameFull: Boutamart, Mustapha – PersonEntity: Name: NameFull: Badica, Petre – PersonEntity: Name: NameFull: Burdusel, Mihail – PersonEntity: Name: NameFull: Secu, Mihail – PersonEntity: Name: NameFull: Pintilie, Lucian – PersonEntity: Name: NameFull: Galca, Aurelian Catalin IsPartOfRelationships: – BibEntity: Dates: – D: 21 M: 05 Text: May2022 Type: published Y: 2022 Identifiers: – Type: issn-print Value: 09574522 Numbering: – Type: volume Value: 33 – Type: issue Value: 15 Titles: – TitleFull: Journal of Materials Science: Materials in Electronics Type: main |
| ResultId | 1 |