Engineering the resistive switching properties of 2D WS2 memristor: role of band gap.

Saved in:
Bibliographic Details
Title: Engineering the resistive switching properties of 2D WS2 memristor: role of band gap.
Authors: Cao, Qing1 (AUTHOR), Zou, Pengfei1 (AUTHOR), Li, Pengcheng2 (AUTHOR), Xiong, Limiao1 (AUTHOR), Bi, Hailin1 (AUTHOR), Wu, Jun1 (AUTHOR) wujun@hfut.edu.cn
Source: Journal of Materials Science: Materials in Electronics. Jan2023, Vol. 34 Issue 3, p1-9. 9p.
Subjects: Band gaps, Memristors, Electrical conductivity transitions, Centrifugation, Space charge, Energy bands, Charge transfer
Abstract: WS2 with different layers were prepared by liquid-phase cascade centrifugation and then applied to fabricate Ag/WS2/Cu memristors. The correlation between WS2 layers and band gap was studied and the influence of the change in WS2 band gap on the switching characteristics was analyzed. It is found that as the thickness and layer number of WS2 decrease, the band gap gradually increases. The Ag/WS2/Cu devices exhibit bipolar resistive switching behavior. The larger the band gap of WS2, the smaller the switching voltage and the larger the switching ratio of the corresponding memristors. The double logarithm I–V curves verify that the switching mechanism of the devices is the trap-controlled space charge limited current mechanism. In addition, the charge transfer process is further explained with the energy band diagram and the differential charge density of Ag/WS2/Cu. This work can lay a theoretical foundation for the design and optimization of the switching performance of transition metal dichalcogenides (TMDs) memristors. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Materials Science: Materials in Electronics is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
Full text is not displayed to guests.
Description
Abstract:WS2 with different layers were prepared by liquid-phase cascade centrifugation and then applied to fabricate Ag/WS2/Cu memristors. The correlation between WS2 layers and band gap was studied and the influence of the change in WS2 band gap on the switching characteristics was analyzed. It is found that as the thickness and layer number of WS2 decrease, the band gap gradually increases. The Ag/WS2/Cu devices exhibit bipolar resistive switching behavior. The larger the band gap of WS2, the smaller the switching voltage and the larger the switching ratio of the corresponding memristors. The double logarithm I–V curves verify that the switching mechanism of the devices is the trap-controlled space charge limited current mechanism. In addition, the charge transfer process is further explained with the energy band diagram and the differential charge density of Ag/WS2/Cu. This work can lay a theoretical foundation for the design and optimization of the switching performance of transition metal dichalcogenides (TMDs) memristors. [ABSTRACT FROM AUTHOR]
ISSN:09574522
DOI:10.1007/s10854-022-09612-9