Bibliographic Details
| Title: |
Strain-induced Aharonov-Bohm effect at nanoscale and ground state of a carbon nanotube with zigzag edges. |
| Authors: |
Rycerz, Adam1 (AUTHOR) rycerz@th.if.uj.edu.pl, Fidrysiak, Maciej1 (AUTHOR), Goc-Jagło, Danuta1 (AUTHOR) |
| Source: |
Journal of Magnetism & Magnetic Materials. Dec2023, Vol. 587, pN.PAG-N.PAG. 1p. |
| Subjects: |
Aharonov-Bohm effect, Hubbard model, Electron configuration, Band gaps, Magnetic flux, Carbon nanotubes, Metal-insulator transitions |
| Abstract: |
Magnetic flux piercing a carbon nanotube induce periodic gap oscillations which represent the Aharonov-Bohm effect at nanoscale. Here we point out, by analyzing numerically the anisotropic Hubbard model on a honeycomb lattice, that similar oscillations should be observable when uniaxial strain is applied to a nanotube. In both cases, a vector potential (magnetic- or strain-induced) may affect the measurable quantities at zero field. The analysis, carried out within the Gutzwiller Approximation, shows that for small semiconducting nanotube with zigzag edges and realistic value of the Hubbard repulsion (U / t 0 = 1. 6 , with t 0 ≈ 2. 5 eV being the equilibrium hopping integral) energy gap can be reduced by a factor of more than 100 due to the strain. • Periodic gap oscillations are found for semiconducting nanotube with zigzag edges upon longitudinal strain. • Gutzwiller approximation is applied to determine the role of electron correlations. • The interpretation of the phenomena as a version of the Aharonov-Bohm effect is put forward. [ABSTRACT FROM AUTHOR] |
|
Copyright of Journal of Magnetism & Magnetic Materials is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) |
| Database: |
Engineering Source |