Semitransparent Organic Photovoltaic Devices: Interface/Bulk Properties and Stability Issues.
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| Title: | Semitransparent Organic Photovoltaic Devices: Interface/Bulk Properties and Stability Issues. |
|---|---|
| Authors: | Paci, Barbara1 (AUTHOR) barbara.paci@ism.cnr.it, Righi Riva, Flavia1 (AUTHOR), Generosi, Amanda1 (AUTHOR), Guaragno, Marco1 (AUTHOR), Mangiacapre, Emanuela2 (AUTHOR), Brutti, Sergio2 (AUTHOR), Wagner, Michael3,4 (AUTHOR), Distler, Andreas4 (AUTHOR), Egelhaaf, Hans-Joachim3,4 (AUTHOR) |
| Source: | Nanomaterials (2079-4991). Feb2024, Vol. 14 Issue 3, p269. 14p. |
| Subjects: | X-ray reflectometry, Atomic force microscopy, Interface stability, Molybdenum oxides, Thin films |
| Abstract: | In the present work, an insight on the morpho/structural properties of semitransparent organic devices for buildings' integrated photovoltaics is presented, and issues related to interface and bulk stability are addressed. The organic photovoltaic (OPV) cells under investigation are characterized by a blend of PM6:Y6 as a photo-active layer, a ZnO ETL (electron transporting layer), a HTL (hole transporting layer) of HTL-X and a transparent electrode composed by Ag nanowires (AgNWs). The devices' active nanomaterials, processed as thin films, and their mutual nanoscale interfaces are investigated by a combination of in situ Energy Dispersive X-ray Reflectometry (EDXR) and ex situ Atomic Force Microscopy (AFM), X-ray Diffraction (XRD) and micro-Raman spectroscopy. In order to discriminate among diverse concomitant aging pathways potentially occurring upon working conditions, the effects of different stress factors were investigated: light and temperature. Evidence is gained of an essential structural stability, although an increased roughness at the ZnO/PM6:Y6 interface is deduced by EDXR measurements. On the contrary, an overall stability of the system subjected to thermal stress in the dark was observed, which is a clear indication of the photo-induced origin of the observed degradation phenomenon. Micro-Raman spectroscopy brings light on the origin of such effect, evidencing a photo-oxidation process of the active material in the device, using hygroscopic organic HTL, during continuous illumination in ambient moisture conditions. The process may be also triggered by a photocatalytic role of the ZnO layer. Therefore, an alternative configuration is proposed, where the hygroscopic HTL-X is replaced by the inorganic compound MoOx. The results show that such alternative configuration is stable under light stress (solar simulator), suggesting that the use of Molybdenum Oxide, limiting the photo-oxidation of the bulk PM6:Y6 active material, can prevent the cell from degradation. [ABSTRACT FROM AUTHOR] |
| Copyright of Nanomaterials (2079-4991) is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
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| Header | DbId: egs DbLabel: Engineering Source An: 175369909 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Semitransparent Organic Photovoltaic Devices: Interface/Bulk Properties and Stability Issues. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Paci%2C+Barbara%22">Paci, Barbara</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> barbara.paci@ism.cnr.it</i><br /><searchLink fieldCode="AR" term="%22Righi+Riva%2C+Flavia%22">Righi Riva, Flavia</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Generosi%2C+Amanda%22">Generosi, Amanda</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Guaragno%2C+Marco%22">Guaragno, Marco</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Mangiacapre%2C+Emanuela%22">Mangiacapre, Emanuela</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Brutti%2C+Sergio%22">Brutti, Sergio</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Wagner%2C+Michael%22">Wagner, Michael</searchLink><relatesTo>3,4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Distler%2C+Andreas%22">Distler, Andreas</searchLink><relatesTo>4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Egelhaaf%2C+Hans-Joachim%22">Egelhaaf, Hans-Joachim</searchLink><relatesTo>3,4</relatesTo> (AUTHOR) – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Nanomaterials+%282079-4991%29%22">Nanomaterials (2079-4991)</searchLink>. Feb2024, Vol. 14 Issue 3, p269. 14p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22X-ray+reflectometry%22">X-ray reflectometry</searchLink><br /><searchLink fieldCode="DE" term="%22Atomic+force+microscopy%22">Atomic force microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Interface+stability%22">Interface stability</searchLink><br /><searchLink fieldCode="DE" term="%22Molybdenum+oxides%22">Molybdenum oxides</searchLink><br /><searchLink fieldCode="DE" term="%22Thin+films%22">Thin films</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: In the present work, an insight on the morpho/structural properties of semitransparent organic devices for buildings' integrated photovoltaics is presented, and issues related to interface and bulk stability are addressed. The organic photovoltaic (OPV) cells under investigation are characterized by a blend of PM6:Y6 as a photo-active layer, a ZnO ETL (electron transporting layer), a HTL (hole transporting layer) of HTL-X and a transparent electrode composed by Ag nanowires (AgNWs). The devices' active nanomaterials, processed as thin films, and their mutual nanoscale interfaces are investigated by a combination of in situ Energy Dispersive X-ray Reflectometry (EDXR) and ex situ Atomic Force Microscopy (AFM), X-ray Diffraction (XRD) and micro-Raman spectroscopy. In order to discriminate among diverse concomitant aging pathways potentially occurring upon working conditions, the effects of different stress factors were investigated: light and temperature. Evidence is gained of an essential structural stability, although an increased roughness at the ZnO/PM6:Y6 interface is deduced by EDXR measurements. On the contrary, an overall stability of the system subjected to thermal stress in the dark was observed, which is a clear indication of the photo-induced origin of the observed degradation phenomenon. Micro-Raman spectroscopy brings light on the origin of such effect, evidencing a photo-oxidation process of the active material in the device, using hygroscopic organic HTL, during continuous illumination in ambient moisture conditions. The process may be also triggered by a photocatalytic role of the ZnO layer. Therefore, an alternative configuration is proposed, where the hygroscopic HTL-X is replaced by the inorganic compound MoOx. The results show that such alternative configuration is stable under light stress (solar simulator), suggesting that the use of Molybdenum Oxide, limiting the photo-oxidation of the bulk PM6:Y6 active material, can prevent the cell from degradation. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Nanomaterials (2079-4991) is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=175369909 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.3390/nano14030269 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 14 StartPage: 269 Subjects: – SubjectFull: X-ray reflectometry Type: general – SubjectFull: Atomic force microscopy Type: general – SubjectFull: Interface stability Type: general – SubjectFull: Molybdenum oxides Type: general – SubjectFull: Thin films Type: general Titles: – TitleFull: Semitransparent Organic Photovoltaic Devices: Interface/Bulk Properties and Stability Issues. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Paci, Barbara – PersonEntity: Name: NameFull: Righi Riva, Flavia – PersonEntity: Name: NameFull: Generosi, Amanda – PersonEntity: Name: NameFull: Guaragno, Marco – PersonEntity: Name: NameFull: Mangiacapre, Emanuela – PersonEntity: Name: NameFull: Brutti, Sergio – PersonEntity: Name: NameFull: Wagner, Michael – PersonEntity: Name: NameFull: Distler, Andreas – PersonEntity: Name: NameFull: Egelhaaf, Hans-Joachim IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 02 Text: Feb2024 Type: published Y: 2024 Identifiers: – Type: issn-print Value: 20794991 Numbering: – Type: volume Value: 14 – Type: issue Value: 3 Titles: – TitleFull: Nanomaterials (2079-4991) Type: main |
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