Exploration of physical properties of DC magnetron sputtered titania thin films and performance evaluation of Au/titania-based ultraviolet photodetectors.
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| Title: | Exploration of physical properties of DC magnetron sputtered titania thin films and performance evaluation of Au/titania-based ultraviolet photodetectors. |
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| Authors: | Jagadish, K. A.1 (AUTHOR), Kekuda, Dhananjaya1 (AUTHOR) dhaya.kekuda@manipal.edu |
| Source: | Journal of Materials Science: Materials in Electronics. Nov2024, Vol. 35 Issue 31, p1-15. 15p. |
| Subjects: | DC sputtering, Schottky barrier diodes, Surface roughness, Schottky barrier, Thin films, Magnetron sputtering |
| Abstract: | The present work demonstrates the impact of oxygen flow rates on various properties of TiO2 thin films grown using DC magnetron sputtering. The XRD studies verified the materials' polycrystalline nature. Surface roughness variation with oxygen flow rate was noticed using AFM analysis. The optical energy bandgap was found to vary between 3.42 and 3.75 eV. The electrical and photo-sensing properties of the TiO2 layer were thoroughly examined. The constructed Au/TiO2 junction exhibited a Schottky barrier with a three-order rectification ratio recorded under dark mode. The sensor parameters such as responsivity, detectivity, response time, and linear dynamic range were carefully studied. Under UV (395 nm, 0.5 mW/cm2) irradiation, the diode fabricated at 18% of oxygen flow rate (Au/TiO2-18/ITO) had a photoresponsivity of 0.209 A/W and a steady photo detectivity of 4.03 × 1010 Jones at room temperature. Remarkably, a response time of 520/133 ms was reported. Thus, our findings indicate that Au/TiO2 Schottky diodes might be beneficial for visible, transparent UV photosensors in future optoelectronic applications. [ABSTRACT FROM AUTHOR] |
| Copyright of Journal of Materials Science: Materials in Electronics is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
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| Header | DbId: egs DbLabel: Engineering Source An: 180628690 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Exploration of physical properties of DC magnetron sputtered titania thin films and performance evaluation of Au/titania-based ultraviolet photodetectors. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Jagadish%2C+K%2E+A%2E%22">Jagadish, K. A.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Kekuda%2C+Dhananjaya%22">Kekuda, Dhananjaya</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> dhaya.kekuda@manipal.edu</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>. Nov2024, Vol. 35 Issue 31, p1-15. 15p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22DC+sputtering%22">DC sputtering</searchLink><br /><searchLink fieldCode="DE" term="%22Schottky+barrier+diodes%22">Schottky barrier diodes</searchLink><br /><searchLink fieldCode="DE" term="%22Surface+roughness%22">Surface roughness</searchLink><br /><searchLink fieldCode="DE" term="%22Schottky+barrier%22">Schottky barrier</searchLink><br /><searchLink fieldCode="DE" term="%22Thin+films%22">Thin films</searchLink><br /><searchLink fieldCode="DE" term="%22Magnetron+sputtering%22">Magnetron sputtering</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: The present work demonstrates the impact of oxygen flow rates on various properties of TiO2 thin films grown using DC magnetron sputtering. The XRD studies verified the materials' polycrystalline nature. Surface roughness variation with oxygen flow rate was noticed using AFM analysis. The optical energy bandgap was found to vary between 3.42 and 3.75 eV. The electrical and photo-sensing properties of the TiO2 layer were thoroughly examined. The constructed Au/TiO2 junction exhibited a Schottky barrier with a three-order rectification ratio recorded under dark mode. The sensor parameters such as responsivity, detectivity, response time, and linear dynamic range were carefully studied. Under UV (395 nm, 0.5 mW/cm2) irradiation, the diode fabricated at 18% of oxygen flow rate (Au/TiO2-18/ITO) had a photoresponsivity of 0.209 A/W and a steady photo detectivity of 4.03 × 1010 Jones at room temperature. Remarkably, a response time of 520/133 ms was reported. Thus, our findings indicate that Au/TiO2 Schottky diodes might be beneficial for visible, transparent UV photosensors in future optoelectronic applications. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Journal of Materials Science: Materials in Electronics is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s10854-024-13752-5 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 15 StartPage: 1 Subjects: – SubjectFull: DC sputtering Type: general – SubjectFull: Schottky barrier diodes Type: general – SubjectFull: Surface roughness Type: general – SubjectFull: Schottky barrier Type: general – SubjectFull: Thin films Type: general – SubjectFull: Magnetron sputtering Type: general Titles: – TitleFull: Exploration of physical properties of DC magnetron sputtered titania thin films and performance evaluation of Au/titania-based ultraviolet photodetectors. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Jagadish, K. A. – PersonEntity: Name: NameFull: Kekuda, Dhananjaya IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 11 Text: Nov2024 Type: published Y: 2024 Identifiers: – Type: issn-print Value: 09574522 Numbering: – Type: volume Value: 35 – Type: issue Value: 31 Titles: – TitleFull: Journal of Materials Science: Materials in Electronics Type: main |
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