SIMS and Numerical Analysis of Asymmetrical Out-Diffusion of Hydrogen and Carbon in Cd x Zn 1− x O:Eu Multilayer.
Saved in:
| Title: | SIMS and Numerical Analysis of Asymmetrical Out-Diffusion of Hydrogen and Carbon in Cd x Zn 1− x O:Eu Multilayer. |
|---|---|
| Authors: | Khosravizadeh, Zeinab1 (AUTHOR) khosravi@ifpan.edu.pl, Lysak, Anastasiia1 (AUTHOR), Przeździecka, Ewa1 (AUTHOR), Jakieła, Rafał1 (AUTHOR) |
| Source: | Materials (1996-1944). Nov2024, Vol. 17 Issue 21, p5240. 15p. |
| Subjects: | Secondary ion mass spectrometry, Surface diffusion, Depth profiling, Activation energy, Numerical analysis |
| Abstract: | This study employs secondary ion mass spectrometry (SIMS) to investigate the diffusion behavior of hydrogen and carbon in a CdxZn1−xO:Eu multilayer at different annealing temperatures (500–900 °C). The SIMS results reveal a significant out-diffusion of these elements toward the surface and diffusion to the interface region. The diffusion flow rates are asymmetric and favor the interface direction. The depth profiles of diffused elements are fitted using the forward timecentered space (FTCS) iteration method. The activation energies are determined to be 0.35 ± 0.06 eV for hydrogen and 0.33 ± 0.09 eV for carbon, suggesting an interstitial mechanism in CdxZn1−xO. The results indicate that increasing the annealing temperatures leads to a significant decrease in impurity concentrations. [ABSTRACT FROM AUTHOR] |
| Copyright of Materials (1996-1944) is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
|
Full text is not displayed to guests.
Login for full access.
|
|
| Abstract: | This study employs secondary ion mass spectrometry (SIMS) to investigate the diffusion behavior of hydrogen and carbon in a CdxZn1−xO:Eu multilayer at different annealing temperatures (500–900 °C). The SIMS results reveal a significant out-diffusion of these elements toward the surface and diffusion to the interface region. The diffusion flow rates are asymmetric and favor the interface direction. The depth profiles of diffused elements are fitted using the forward timecentered space (FTCS) iteration method. The activation energies are determined to be 0.35 ± 0.06 eV for hydrogen and 0.33 ± 0.09 eV for carbon, suggesting an interstitial mechanism in CdxZn1−xO. The results indicate that increasing the annealing temperatures leads to a significant decrease in impurity concentrations. [ABSTRACT FROM AUTHOR] |
|---|---|
| ISSN: | 19961944 |
| DOI: | 10.3390/ma17215240 |
