Microstructural and chemical effects of the argon cluster bombardment on a single crystal KGd(WO4)2 surface.
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| Title: | Microstructural and chemical effects of the argon cluster bombardment on a single crystal KGd(WO |
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| Authors: | Korobeishchikov, Nikolay G.1 (AUTHOR), Nikolaev, Ivan V.1 (AUTHOR), Atuchin, Victor V.2,3,4,5,6 (AUTHOR) atuchin@isp.nsc.ru, Gerasimov, Evgeny Y.7 (AUTHOR), Tolstoguzov, Alexander8,9,10 (AUTHOR), Abudouwufu, Tushagu11 (AUTHOR), Fu, Dejun11 (AUTHOR) |
| Source: | Applied Physics A: Materials Science & Processing. Nov2024, Vol. 130 Issue 11, p1-9. 9p. |
| Subjects: | Optical materials, Complex ions, Depth profiling, Transmission electron microscopy, Crystal surfaces |
| Abstract: | To elucidate the influence of gas cluster-induced impacts on the deep structure of disturbances in tungstate optical materials, experimental studies were carried out. The precision-polished surface of a KGd(WO4)2 (KGW) single crystal was processed by an argon cluster ion beam with the average cluster size of 1000 atom/cluster at the energy of 10 keV, which ensures minimal damage and high processing efficiency. By using high-resolution TEM and EDX techniques of the transversely cut lamellae, the alterations in both the structure and chemical composition at varying depths were explore. In a 15 nm thick subsurface layer of the initial specimen, a nonuniform depth distribution was found for the constituent atoms of KGW. The results showed that, after the cluster bombardment, the initial amorphous layer thickness resulting from precision chemical–mechanical polishing was decreased from 50 to 23 nm. The distribution nonuniformity of constituent KGW atoms decreases in the upper subsurface layer, while it increases at greater depths. [ABSTRACT FROM AUTHOR] |
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| Database: | Engineering Source |
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| Abstract: | To elucidate the influence of gas cluster-induced impacts on the deep structure of disturbances in tungstate optical materials, experimental studies were carried out. The precision-polished surface of a KGd(WO4)2 (KGW) single crystal was processed by an argon cluster ion beam with the average cluster size of 1000 atom/cluster at the energy of 10 keV, which ensures minimal damage and high processing efficiency. By using high-resolution TEM and EDX techniques of the transversely cut lamellae, the alterations in both the structure and chemical composition at varying depths were explore. In a 15 nm thick subsurface layer of the initial specimen, a nonuniform depth distribution was found for the constituent atoms of KGW. The results showed that, after the cluster bombardment, the initial amorphous layer thickness resulting from precision chemical–mechanical polishing was decreased from 50 to 23 nm. The distribution nonuniformity of constituent KGW atoms decreases in the upper subsurface layer, while it increases at greater depths. [ABSTRACT FROM AUTHOR] |
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| ISSN: | 09478396 |
| DOI: | 10.1007/s00339-024-07995-6 |
