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In-field Built-in Self-Test for Detecting Incipient Faults in Analog Reconfigurable Filters.

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Title: In-field Built-in Self-Test for Detecting Incipient Faults in Analog Reconfigurable Filters.
Authors: Vélez Ibarra, María Delfina1 (AUTHOR) delfinavelez@unc.edu.ar, Vodanovic, Gonzalo1,2 (AUTHOR) gvodanovic@unc.edu.ar, Laprovitta, Agustín1,3 (AUTHOR) alaprovitta@unc.edu.ar, Peretti, Gabriela1,2 (AUTHOR) gabriela.peretti@unc.edu.ar, Romero, Eduardo1,2 (AUTHOR) eromero@frvm.utn.edu.ar
Source: Circuits, Systems & Signal Processing. Feb2025, Vol. 44 Issue 2, p715-748. 34p.
Subjects: Signal generators, Artificial intelligence, Signal processing, Integrated circuits, Transient analysis
Abstract: In critical applications, a fault in the analog sections of a complex integrated circuit implies severe risks, compromising the mission or potentially causing harm to the people or the ambient. In this context, detecting faults during the operation in the field becomes mandatory, and built-in self-test (BIST) arises as suitable for this purpose. This paper presents an innovative user-oriented in-field BIST solution for switched-capacitor (SC) filters embedded in analog-configurable PSoC™ analog coprocessor (PSoC-AC) from Infineon Technologies AG. The BIST targets catastrophic faults in switches and deviation faults in capacitors, adopting the single-fault paradigm. The method is based on comparing the time-domain responses of the filter (for step input) against a pre-established pattern using a low computational cost signal similarity measure (SSM). The scheme implements the test signal generator and response analyzer with the resources available in the selected platform. This, along with the simple SSM used, achieves zero hardware overhead and low penalty in the memory available for the user application. The method does not require sophisticated signal processing techniques, reducing it to a simple offset removal process. The paper reports an extensive experimental fault injection and measurements campaign. Additionally, it extends the evaluations through fault simulation characterization using a low-cost filter model to establish the lowest deviation fault the method can detect in capacitors. The results show an outstanding performance, detecting all the considered catastrophic faults. Regarding deviation faults, the method detects incipient ones, which is a relevant aspect because the BIST can detect degradations at an early stage. [ABSTRACT FROM AUTHOR]
Copyright of Circuits, Systems & Signal Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: In-field Built-in Self-Test for Detecting Incipient Faults in Analog Reconfigurable Filters.
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  Data: <searchLink fieldCode="AR" term="%22Vélez+Ibarra%2C+María+Delfina%22">Vélez Ibarra, María Delfina</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> delfinavelez@unc.edu.ar</i><br /><searchLink fieldCode="AR" term="%22Vodanovic%2C+Gonzalo%22">Vodanovic, Gonzalo</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> gvodanovic@unc.edu.ar</i><br /><searchLink fieldCode="AR" term="%22Laprovitta%2C+Agustín%22">Laprovitta, Agustín</searchLink><relatesTo>1,3</relatesTo> (AUTHOR)<i> alaprovitta@unc.edu.ar</i><br /><searchLink fieldCode="AR" term="%22Peretti%2C+Gabriela%22">Peretti, Gabriela</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> gabriela.peretti@unc.edu.ar</i><br /><searchLink fieldCode="AR" term="%22Romero%2C+Eduardo%22">Romero, Eduardo</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> eromero@frvm.utn.edu.ar</i>
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  Data: <searchLink fieldCode="JN" term="%22Circuits%2C+Systems+%26+Signal+Processing%22">Circuits, Systems & Signal Processing</searchLink>. Feb2025, Vol. 44 Issue 2, p715-748. 34p.
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  Data: In critical applications, a fault in the analog sections of a complex integrated circuit implies severe risks, compromising the mission or potentially causing harm to the people or the ambient. In this context, detecting faults during the operation in the field becomes mandatory, and built-in self-test (BIST) arises as suitable for this purpose. This paper presents an innovative user-oriented in-field BIST solution for switched-capacitor (SC) filters embedded in analog-configurable PSoC™ analog coprocessor (PSoC-AC) from Infineon Technologies AG. The BIST targets catastrophic faults in switches and deviation faults in capacitors, adopting the single-fault paradigm. The method is based on comparing the time-domain responses of the filter (for step input) against a pre-established pattern using a low computational cost signal similarity measure (SSM). The scheme implements the test signal generator and response analyzer with the resources available in the selected platform. This, along with the simple SSM used, achieves zero hardware overhead and low penalty in the memory available for the user application. The method does not require sophisticated signal processing techniques, reducing it to a simple offset removal process. The paper reports an extensive experimental fault injection and measurements campaign. Additionally, it extends the evaluations through fault simulation characterization using a low-cost filter model to establish the lowest deviation fault the method can detect in capacitors. The results show an outstanding performance, detecting all the considered catastrophic faults. Regarding deviation faults, the method detects incipient ones, which is a relevant aspect because the BIST can detect degradations at an early stage. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Circuits, Systems & Signal Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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      – TitleFull: In-field Built-in Self-Test for Detecting Incipient Faults in Analog Reconfigurable Filters.
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            NameFull: Vélez Ibarra, María Delfina
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              Text: Feb2025
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