Bayesian Point Estimation of Linear/Circular Consecutive k-out-of-n:F System Reliability Under Vague Environment.

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Bibliographic Details
Title:	Bayesian Point Estimation of Linear/Circular Consecutive k-out-of-n:F System Reliability Under Vague Environment.
Authors:	Madhumitha, J.¹ (AUTHOR) madhumij@srmist.edu.in, Vijayalakshmi, G.² (AUTHOR) vijayalgsrm@gmail.com
Source:	International Journal of Reliability, Quality & Safety Engineering. Feb2025, Vol. 32 Issue 1, p1-25. 25p.
Subjects:	Reliability in engineering, Fix-point estimation, Error functions, Random variables, Information storage & retrieval systems
Abstract:	The paper proposes a Bayesian approach to estimate the reliability and mean time to failure (MTTF) of linear and circular consecutive k -out-of- n : F systems under vague environments, where uncertainties are represented using vague sets. By assuming model parameters as vague random variables with vague prior distributions, the study employs the Resolution Identity theorem for vague sets to resolve and structure this vagueness within the Bayesian framework. The proposed method uses the squared error loss function to derive vague Bayesian estimates, providing a more realistic and comprehensive analysis of system reliability in the presence of uncertainty. Numerical illustrations are included to demonstrate the applicability and effectiveness of the approach, highlighting its potential for handling vague information in complex system reliability analysis. [ABSTRACT FROM AUTHOR]
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Database:	Engineering Source

Description
Abstract:	The paper proposes a Bayesian approach to estimate the reliability and mean time to failure (MTTF) of linear and circular consecutive k -out-of- n : F systems under vague environments, where uncertainties are represented using vague sets. By assuming model parameters as vague random variables with vague prior distributions, the study employs the Resolution Identity theorem for vague sets to resolve and structure this vagueness within the Bayesian framework. The proposed method uses the squared error loss function to derive vague Bayesian estimates, providing a more realistic and comprehensive analysis of system reliability in the presence of uncertainty. Numerical illustrations are included to demonstrate the applicability and effectiveness of the approach, highlighting its potential for handling vague information in complex system reliability analysis. [ABSTRACT FROM AUTHOR]
ISSN:	02185393
DOI:	10.1142/S0218539324500517