Femtosecond Laser Ablation (fs‐LA) XPS Depth Profiling of Lead Halide Perovskite Thin Film Solar Cells.
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| Title: | Femtosecond Laser Ablation (fs‐LA) XPS Depth Profiling of Lead Halide Perovskite Thin Film Solar Cells. |
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| Authors: | Chandler, C. W.1 (AUTHOR) c.w.chandler@surrey.ac.uk, Devadasan, D. S.2 (AUTHOR), Bacon, S. R.1,2 (AUTHOR), Yun, J. S.3 (AUTHOR), Park, H. H.4,5 (AUTHOR), Nunney, T. S.2 (AUTHOR), Baker, M. A.1 (AUTHOR) |
| Source: | Surface & Interface Analysis: SIA. Mar2025, Vol. 57 Issue 3, p246-252. 7p. |
| Subjects: | Depth profiling, Laser ablation, Complex ions, Ion bombardment, Lead halides, Solar cells |
| Abstract: | Mixed organic–inorganic halide perovskites are finding strong interest as thin film solar cell materials. XPS depth profiling of a spin‐coated (FAPbI3)0.95(MAPbBr3)0.05 perovskite thin‐film solar cell, has been performed. Profiles have been recorded using traditional monatomic and cluster ion beam bombardment and compared to those obtained using a new femtosecond laser ablation (fs‐LA) approach. The femtosecond laser employed has a wavelength of 1030 nm and a pulse length of 160 fs. Monatomic and cluster ion sputter depth profiling of the halide perovskite results in preferential sputtering of C, N and I and the appearance of Pb0 in the Pb 4f spectrum as a preferential sputtering artefact. fs‐LA depth profiling is shown to retain the original composition and chemical state information of the perovskite layer with no chemical damage. An ablation rate of ≈33 nm through the perovskite layer was found at an incident laser energy of 42 μJ per pulse. A combined fs‐LA/monatomic sputtering depth profile enabled all layers in the cell to be identified whilst retaining the true composition of the perovskite layer. [ABSTRACT FROM AUTHOR] |
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| Database: | Engineering Source |
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| Abstract: | Mixed organic–inorganic halide perovskites are finding strong interest as thin film solar cell materials. XPS depth profiling of a spin‐coated (FAPbI3)0.95(MAPbBr3)0.05 perovskite thin‐film solar cell, has been performed. Profiles have been recorded using traditional monatomic and cluster ion beam bombardment and compared to those obtained using a new femtosecond laser ablation (fs‐LA) approach. The femtosecond laser employed has a wavelength of 1030 nm and a pulse length of 160 fs. Monatomic and cluster ion sputter depth profiling of the halide perovskite results in preferential sputtering of C, N and I and the appearance of Pb0 in the Pb 4f spectrum as a preferential sputtering artefact. fs‐LA depth profiling is shown to retain the original composition and chemical state information of the perovskite layer with no chemical damage. An ablation rate of ≈33 nm through the perovskite layer was found at an incident laser energy of 42 μJ per pulse. A combined fs‐LA/monatomic sputtering depth profile enabled all layers in the cell to be identified whilst retaining the true composition of the perovskite layer. [ABSTRACT FROM AUTHOR] |
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| ISSN: | 01422421 |
| DOI: | 10.1002/sia.7374 |
