Femtosecond Laser Ablation (fs‐LA) XPS Depth Profiling of Lead Halide Perovskite Thin Film Solar Cells.
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| Title: | Femtosecond Laser Ablation (fs‐LA) XPS Depth Profiling of Lead Halide Perovskite Thin Film Solar Cells. |
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| Authors: | Chandler, C. W.1 (AUTHOR) c.w.chandler@surrey.ac.uk, Devadasan, D. S.2 (AUTHOR), Bacon, S. R.1,2 (AUTHOR), Yun, J. S.3 (AUTHOR), Park, H. H.4,5 (AUTHOR), Nunney, T. S.2 (AUTHOR), Baker, M. A.1 (AUTHOR) |
| Source: | Surface & Interface Analysis: SIA. Mar2025, Vol. 57 Issue 3, p246-252. 7p. |
| Subjects: | Depth profiling, Laser ablation, Complex ions, Ion bombardment, Lead halides, Solar cells |
| Abstract: | Mixed organic–inorganic halide perovskites are finding strong interest as thin film solar cell materials. XPS depth profiling of a spin‐coated (FAPbI3)0.95(MAPbBr3)0.05 perovskite thin‐film solar cell, has been performed. Profiles have been recorded using traditional monatomic and cluster ion beam bombardment and compared to those obtained using a new femtosecond laser ablation (fs‐LA) approach. The femtosecond laser employed has a wavelength of 1030 nm and a pulse length of 160 fs. Monatomic and cluster ion sputter depth profiling of the halide perovskite results in preferential sputtering of C, N and I and the appearance of Pb0 in the Pb 4f spectrum as a preferential sputtering artefact. fs‐LA depth profiling is shown to retain the original composition and chemical state information of the perovskite layer with no chemical damage. An ablation rate of ≈33 nm through the perovskite layer was found at an incident laser energy of 42 μJ per pulse. A combined fs‐LA/monatomic sputtering depth profile enabled all layers in the cell to be identified whilst retaining the true composition of the perovskite layer. [ABSTRACT FROM AUTHOR] |
| Copyright of Surface & Interface Analysis: SIA is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
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| Header | DbId: egs DbLabel: Engineering Source An: 183851014 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Femtosecond Laser Ablation (fs‐LA) XPS Depth Profiling of Lead Halide Perovskite Thin Film Solar Cells. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Chandler%2C+C%2E W%2E%22">Chandler, C. W.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> c.w.chandler@surrey.ac.uk</i><br /><searchLink fieldCode="AR" term="%22Devadasan%2C+D%2E S%2E%22">Devadasan, D. S.</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Bacon%2C+S%2E R%2E%22">Bacon, S. R.</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Yun%2C+J%2E S%2E%22">Yun, J. S.</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Park%2C+H%2E H%2E%22">Park, H. H.</searchLink><relatesTo>4,5</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Nunney%2C+T%2E S%2E%22">Nunney, T. S.</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Baker%2C+M%2E A%2E%22">Baker, M. A.</searchLink><relatesTo>1</relatesTo> (AUTHOR) – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Surface+%26+Interface+Analysis%3A+SIA%22">Surface & Interface Analysis: SIA</searchLink>. Mar2025, Vol. 57 Issue 3, p246-252. 7p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Depth+profiling%22">Depth profiling</searchLink><br /><searchLink fieldCode="DE" term="%22Laser+ablation%22">Laser ablation</searchLink><br /><searchLink fieldCode="DE" term="%22Complex+ions%22">Complex ions</searchLink><br /><searchLink fieldCode="DE" term="%22Ion+bombardment%22">Ion bombardment</searchLink><br /><searchLink fieldCode="DE" term="%22Lead+halides%22">Lead halides</searchLink><br /><searchLink fieldCode="DE" term="%22Solar+cells%22">Solar cells</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Mixed organic–inorganic halide perovskites are finding strong interest as thin film solar cell materials. XPS depth profiling of a spin‐coated (FAPbI3)0.95(MAPbBr3)0.05 perovskite thin‐film solar cell, has been performed. Profiles have been recorded using traditional monatomic and cluster ion beam bombardment and compared to those obtained using a new femtosecond laser ablation (fs‐LA) approach. The femtosecond laser employed has a wavelength of 1030 nm and a pulse length of 160 fs. Monatomic and cluster ion sputter depth profiling of the halide perovskite results in preferential sputtering of C, N and I and the appearance of Pb0 in the Pb 4f spectrum as a preferential sputtering artefact. fs‐LA depth profiling is shown to retain the original composition and chemical state information of the perovskite layer with no chemical damage. An ablation rate of ≈33 nm through the perovskite layer was found at an incident laser energy of 42 μJ per pulse. A combined fs‐LA/monatomic sputtering depth profile enabled all layers in the cell to be identified whilst retaining the true composition of the perovskite layer. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Surface & Interface Analysis: SIA is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1002/sia.7374 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 7 StartPage: 246 Subjects: – SubjectFull: Depth profiling Type: general – SubjectFull: Laser ablation Type: general – SubjectFull: Complex ions Type: general – SubjectFull: Ion bombardment Type: general – SubjectFull: Lead halides Type: general – SubjectFull: Solar cells Type: general Titles: – TitleFull: Femtosecond Laser Ablation (fs‐LA) XPS Depth Profiling of Lead Halide Perovskite Thin Film Solar Cells. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Chandler, C. W. – PersonEntity: Name: NameFull: Devadasan, D. S. – PersonEntity: Name: NameFull: Bacon, S. R. – PersonEntity: Name: NameFull: Yun, J. S. – PersonEntity: Name: NameFull: Park, H. H. – PersonEntity: Name: NameFull: Nunney, T. S. – PersonEntity: Name: NameFull: Baker, M. A. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 03 Text: Mar2025 Type: published Y: 2025 Identifiers: – Type: issn-print Value: 01422421 Numbering: – Type: volume Value: 57 – Type: issue Value: 3 Titles: – TitleFull: Surface & Interface Analysis: SIA Type: main |
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