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Ion deposition on silica surfaces by spin-drying: Characterization of dried layer thickness and ion deposition.

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Title: Ion deposition on silica surfaces by spin-drying: Characterization of dried layer thickness and ion deposition.
Authors: Noel, P.1 (AUTHOR) paul.noel@cea.fr, Larrey, V.1 (AUTHOR), Truffier-Boutry, D.1 (AUTHOR), Lardin, T.1 (AUTHOR), Fournel, F.1 (AUTHOR), Rieutord, F.2 (AUTHOR)
Source: Applied Surface Science. Aug2025, Vol. 699, pN.PAG-N.PAG. 1p.
Subjects: Silicon surfaces, Optical films, X-ray fluorescence, Ionic solutions, Surface analysis
Abstract: [Display omitted] The deposition of ions or molecules on silicon dioxide surfaces may have interesting applications fields. The deposition by the spin-drying of active ions on silicon dioxide surfaces is studied to understand the mechanisms involved in ion deposition. The dried thickness is calculated with optical thin film interferences and the amount of ions deposited by Total X-Ray Fluorescence. The contributions of ion adsorption, diffuse layer and bulk solution are investigated. These phenomena may occur in many systems which involve the drying of thin ionic solution layer on silicon dioxide surfaces. [ABSTRACT FROM AUTHOR]
Copyright of Applied Surface Science is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 184521503
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Ion deposition on silica surfaces by spin-drying: Characterization of dried layer thickness and ion deposition.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Noel%2C+P%2E%22">Noel, P.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> paul.noel@cea.fr</i><br /><searchLink fieldCode="AR" term="%22Larrey%2C+V%2E%22">Larrey, V.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Truffier-Boutry%2C+D%2E%22">Truffier-Boutry, D.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Lardin%2C+T%2E%22">Lardin, T.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Fournel%2C+F%2E%22">Fournel, F.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Rieutord%2C+F%2E%22">Rieutord, F.</searchLink><relatesTo>2</relatesTo> (AUTHOR)
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Applied+Surface+Science%22">Applied Surface Science</searchLink>. Aug2025, Vol. 699, pN.PAG-N.PAG. 1p.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Silicon+surfaces%22">Silicon surfaces</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+films%22">Optical films</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+fluorescence%22">X-ray fluorescence</searchLink><br /><searchLink fieldCode="DE" term="%22Ionic+solutions%22">Ionic solutions</searchLink><br /><searchLink fieldCode="DE" term="%22Surface+analysis%22">Surface analysis</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: [Display omitted] The deposition of ions or molecules on silicon dioxide surfaces may have interesting applications fields. The deposition by the spin-drying of active ions on silicon dioxide surfaces is studied to understand the mechanisms involved in ion deposition. The dried thickness is calculated with optical thin film interferences and the amount of ions deposited by Total X-Ray Fluorescence. The contributions of ion adsorption, diffuse layer and bulk solution are investigated. These phenomena may occur in many systems which involve the drying of thin ionic solution layer on silicon dioxide surfaces. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Applied Surface Science is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1016/j.apsusc.2025.163095
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 1
        StartPage: N.PAG
    Subjects:
      – SubjectFull: Silicon surfaces
        Type: general
      – SubjectFull: Optical films
        Type: general
      – SubjectFull: X-ray fluorescence
        Type: general
      – SubjectFull: Ionic solutions
        Type: general
      – SubjectFull: Surface analysis
        Type: general
    Titles:
      – TitleFull: Ion deposition on silica surfaces by spin-drying: Characterization of dried layer thickness and ion deposition.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Noel, P.
      – PersonEntity:
          Name:
            NameFull: Larrey, V.
      – PersonEntity:
          Name:
            NameFull: Truffier-Boutry, D.
      – PersonEntity:
          Name:
            NameFull: Lardin, T.
      – PersonEntity:
          Name:
            NameFull: Fournel, F.
      – PersonEntity:
          Name:
            NameFull: Rieutord, F.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 08
              Text: Aug2025
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-print
              Value: 01694332
          Numbering:
            – Type: volume
              Value: 699
          Titles:
            – TitleFull: Applied Surface Science
              Type: main
ResultId 1