Study of transport properties of the series array of YBCO step edge Josephson junctions.

Saved in:
Bibliographic Details
Title: Study of transport properties of the series array of YBCO step edge Josephson junctions.
Authors: Kandari, Rajni1 (AUTHOR), Kumar, Sandeep1,2 (AUTHOR), Khare, Neeraj1,2 (AUTHOR) nkhare@physics.iitd.ernet.in
Source: Applied Physics A: Materials Science & Processing. Jul2025, Vol. 131 Issue 7, p1-8. 8p.
Subjects: High temperature superconductors, Critical currents, Etching techniques, Frequency discriminators, Photolithography
Abstract: In this report, a series array of YBa2Cu3O7 − x step edge Josephson junctions is fabricated on SrTiO3 substrate using photolithography and ion beam etching techniques, and their electrical transport measurements are performed. We have studied the effect of the number of junctions on the parameters of the array, such as critical current Ic and normal state resistance Rn. For this, the measurements are performed for individual junctions as well as the array of the junctions. It is found that the critical current for each junction is almost the same, which indicates that the junctions are fabricated uniformly. Moreover, the normal state resistance increases linearly with the number of junctions in the array. For a single junction at 70 K, the Rn value is found to be ~ 5 Ω, which increases to ~ 12.5 Ω for the array of four junctions connected in series. At 70 K, the critical current Ic for the array of junctions is ~ 490 µA, resulting in an IcRn product of ~ 6 mV, which is good enough for practical applications such as oscillators and high frequency detectors. The temperature dependence analysis of the critical current suggests a superconductor-normal-superconductor (SNS) type behavior of the junction. [ABSTRACT FROM AUTHOR]
Copyright of Applied Physics A: Materials Science & Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
Full text is not displayed to guests.
Description
Abstract:In this report, a series array of YBa2Cu3O7 − x step edge Josephson junctions is fabricated on SrTiO3 substrate using photolithography and ion beam etching techniques, and their electrical transport measurements are performed. We have studied the effect of the number of junctions on the parameters of the array, such as critical current Ic and normal state resistance Rn. For this, the measurements are performed for individual junctions as well as the array of the junctions. It is found that the critical current for each junction is almost the same, which indicates that the junctions are fabricated uniformly. Moreover, the normal state resistance increases linearly with the number of junctions in the array. For a single junction at 70 K, the Rn value is found to be ~ 5 Ω, which increases to ~ 12.5 Ω for the array of four junctions connected in series. At 70 K, the critical current Ic for the array of junctions is ~ 490 µA, resulting in an IcRn product of ~ 6 mV, which is good enough for practical applications such as oscillators and high frequency detectors. The temperature dependence analysis of the critical current suggests a superconductor-normal-superconductor (SNS) type behavior of the junction. [ABSTRACT FROM AUTHOR]
ISSN:09478396
DOI:10.1007/s00339-025-08666-w