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Elemental Depth Profiling in Perovskite Solar Cells by Rutherford Backscattering Spectrometry.

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Title: Elemental Depth Profiling in Perovskite Solar Cells by Rutherford Backscattering Spectrometry.
Authors: Hussain, Taimoor1,2 (AUTHOR) taimoorhussain380@gmail.com, Abbas, Turab Ali2 (AUTHOR) aliturabb@gmail.com, Liu, Kong3 (AUTHOR) liukong@semi.ac.cn, Sultan, Muhammad4 (AUTHOR) muhammad.sultan@kum.edu.pk
Source: Journal of Electronic Materials. Mar2026, Vol. 55 Issue 3, p2581-2587. 7p.
Subjects: Rutherford backscattering spectrometry, Depth profiling, Perovskite, Simulation software, Photovoltaic power generation, Solar cells, Ion migration & velocity
Abstract: Metal halide perovskites exhibit remarkable properties for photovoltaic applications, yet their susceptibility to ion migration within perovskites is a critical phenomenon that profoundly impacts their functionality and stability. Past investigations have generally focused on indirect or destructive experimental techniques used for probing ion migration. In this perspective, we employed the nondestructive technique, Rutherford backscattering spectroscopy (RBS), to resolve the elemental composition in different layers of perovskite solar cells (PSCs) and used it to disentangle the extrinsic and intrinsic ion migration. We demonstrate here the probing capacity of RBS for two different types of PSCs, including inorganic lead halide perovskites and mixed-cation lead halide perovskites, and a complete device. The study highlights RBS as a reliable analytical tool for tracking elemental redistribution in fresh or aged devices. Furthermore, we discusses the diverse methodologies employed to study extrinsic and intrinsic ion migration and interlayer diffusion between various layers of perovskite devices, ranging from experimental techniques to XRUMP and SIMNRA simulations. [ABSTRACT FROM AUTHOR]
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Database: Engineering Source
Description
Abstract:Metal halide perovskites exhibit remarkable properties for photovoltaic applications, yet their susceptibility to ion migration within perovskites is a critical phenomenon that profoundly impacts their functionality and stability. Past investigations have generally focused on indirect or destructive experimental techniques used for probing ion migration. In this perspective, we employed the nondestructive technique, Rutherford backscattering spectroscopy (RBS), to resolve the elemental composition in different layers of perovskite solar cells (PSCs) and used it to disentangle the extrinsic and intrinsic ion migration. We demonstrate here the probing capacity of RBS for two different types of PSCs, including inorganic lead halide perovskites and mixed-cation lead halide perovskites, and a complete device. The study highlights RBS as a reliable analytical tool for tracking elemental redistribution in fresh or aged devices. Furthermore, we discusses the diverse methodologies employed to study extrinsic and intrinsic ion migration and interlayer diffusion between various layers of perovskite devices, ranging from experimental techniques to XRUMP and SIMNRA simulations. [ABSTRACT FROM AUTHOR]
ISSN:03615235
DOI:10.1007/s11664-026-12673-9