Elemental Depth Profiling in Perovskite Solar Cells by Rutherford Backscattering Spectrometry.
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| Title: | Elemental Depth Profiling in Perovskite Solar Cells by Rutherford Backscattering Spectrometry. |
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| Authors: | Hussain, Taimoor1,2 (AUTHOR) taimoorhussain380@gmail.com, Abbas, Turab Ali2 (AUTHOR) aliturabb@gmail.com, Liu, Kong3 (AUTHOR) liukong@semi.ac.cn, Sultan, Muhammad4 (AUTHOR) muhammad.sultan@kum.edu.pk |
| Source: | Journal of Electronic Materials. Mar2026, Vol. 55 Issue 3, p2581-2587. 7p. |
| Subjects: | Rutherford backscattering spectrometry, Depth profiling, Perovskite, Simulation software, Photovoltaic power generation, Solar cells, Ion migration & velocity |
| Abstract: | Metal halide perovskites exhibit remarkable properties for photovoltaic applications, yet their susceptibility to ion migration within perovskites is a critical phenomenon that profoundly impacts their functionality and stability. Past investigations have generally focused on indirect or destructive experimental techniques used for probing ion migration. In this perspective, we employed the nondestructive technique, Rutherford backscattering spectroscopy (RBS), to resolve the elemental composition in different layers of perovskite solar cells (PSCs) and used it to disentangle the extrinsic and intrinsic ion migration. We demonstrate here the probing capacity of RBS for two different types of PSCs, including inorganic lead halide perovskites and mixed-cation lead halide perovskites, and a complete device. The study highlights RBS as a reliable analytical tool for tracking elemental redistribution in fresh or aged devices. Furthermore, we discusses the diverse methodologies employed to study extrinsic and intrinsic ion migration and interlayer diffusion between various layers of perovskite devices, ranging from experimental techniques to XRUMP and SIMNRA simulations. [ABSTRACT FROM AUTHOR] |
| Copyright of Journal of Electronic Materials is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
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| Header | DbId: egs DbLabel: Engineering Source An: 191486998 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Elemental Depth Profiling in Perovskite Solar Cells by Rutherford Backscattering Spectrometry. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Hussain%2C+Taimoor%22">Hussain, Taimoor</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> taimoorhussain380@gmail.com</i><br /><searchLink fieldCode="AR" term="%22Abbas%2C+Turab+Ali%22">Abbas, Turab Ali</searchLink><relatesTo>2</relatesTo> (AUTHOR)<i> aliturabb@gmail.com</i><br /><searchLink fieldCode="AR" term="%22Liu%2C+Kong%22">Liu, Kong</searchLink><relatesTo>3</relatesTo> (AUTHOR)<i> liukong@semi.ac.cn</i><br /><searchLink fieldCode="AR" term="%22Sultan%2C+Muhammad%22">Sultan, Muhammad</searchLink><relatesTo>4</relatesTo> (AUTHOR)<i> muhammad.sultan@kum.edu.pk</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>. Mar2026, Vol. 55 Issue 3, p2581-2587. 7p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Rutherford+backscattering+spectrometry%22">Rutherford backscattering spectrometry</searchLink><br /><searchLink fieldCode="DE" term="%22Depth+profiling%22">Depth profiling</searchLink><br /><searchLink fieldCode="DE" term="%22Perovskite%22">Perovskite</searchLink><br /><searchLink fieldCode="DE" term="%22Simulation+software%22">Simulation software</searchLink><br /><searchLink fieldCode="DE" term="%22Photovoltaic+power+generation%22">Photovoltaic power generation</searchLink><br /><searchLink fieldCode="DE" term="%22Solar+cells%22">Solar cells</searchLink><br /><searchLink fieldCode="DE" term="%22Ion+migration+%26+velocity%22">Ion migration & velocity</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Metal halide perovskites exhibit remarkable properties for photovoltaic applications, yet their susceptibility to ion migration within perovskites is a critical phenomenon that profoundly impacts their functionality and stability. Past investigations have generally focused on indirect or destructive experimental techniques used for probing ion migration. In this perspective, we employed the nondestructive technique, Rutherford backscattering spectroscopy (RBS), to resolve the elemental composition in different layers of perovskite solar cells (PSCs) and used it to disentangle the extrinsic and intrinsic ion migration. We demonstrate here the probing capacity of RBS for two different types of PSCs, including inorganic lead halide perovskites and mixed-cation lead halide perovskites, and a complete device. The study highlights RBS as a reliable analytical tool for tracking elemental redistribution in fresh or aged devices. Furthermore, we discusses the diverse methodologies employed to study extrinsic and intrinsic ion migration and interlayer diffusion between various layers of perovskite devices, ranging from experimental techniques to XRUMP and SIMNRA simulations. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Journal of Electronic Materials is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s11664-026-12673-9 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 7 StartPage: 2581 Subjects: – SubjectFull: Rutherford backscattering spectrometry Type: general – SubjectFull: Depth profiling Type: general – SubjectFull: Perovskite Type: general – SubjectFull: Simulation software Type: general – SubjectFull: Photovoltaic power generation Type: general – SubjectFull: Solar cells Type: general – SubjectFull: Ion migration & velocity Type: general Titles: – TitleFull: Elemental Depth Profiling in Perovskite Solar Cells by Rutherford Backscattering Spectrometry. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Hussain, Taimoor – PersonEntity: Name: NameFull: Abbas, Turab Ali – PersonEntity: Name: NameFull: Liu, Kong – PersonEntity: Name: NameFull: Sultan, Muhammad IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 03 Text: Mar2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 03615235 Numbering: – Type: volume Value: 55 – Type: issue Value: 3 Titles: – TitleFull: Journal of Electronic Materials Type: main |
| ResultId | 1 |
