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Development of a non-destructive elemental analysis method for sub-percent components using muon-induced gamma-rays.

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Title: Development of a non-destructive elemental analysis method for sub-percent components using muon-induced gamma-rays.
Authors: Inagaki, Makoto1 (AUTHOR) inagaki.makoto.2r@kyoto-u.ac.jp, Ninomiya, Kazuhiko2 (AUTHOR), Yoshida, Go3 (AUTHOR), Kubo, Michael Kenya4 (AUTHOR), Yakushi, Kosei2 (AUTHOR), Watanabe, Eisuke3 (AUTHOR), Nakada, Hiroki1 (AUTHOR), Umegaki, Izumi5 (AUTHOR)
Source: Journal of Radioanalytical & Nuclear Chemistry. Jan2026, Vol. 335 Issue 1, p617-623. 7p.
Subjects: Elemental analysis, Gamma rays, Particle beams, Germanium detectors, Light elements, Raw materials, Trace elements
Abstract: A new non-destructive elemental analysis method using muon-induced gamma-rays was developed to quantify sub-percent components in bulk materials, including light elements. Pulsed muon beam irradiation experiments for iron reference samples containing varying silicon concentrations were conducted to demonstrate the method. Characteristic muonic X-rays and gamma-rays emitted from unstable nuclides generated by muon nuclear absorption were measured using germanium detectors during the beam irradiation. By measuring gamma-rays derived from silicon, we successfully quantified the silicon at a concentration of 0.36 wt.% in the bulk iron sample, which is difficult to detect using conventional muon elemental analysis based solely on X-rays. [ABSTRACT FROM AUTHOR]
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Database: Engineering Source
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Abstract:A new non-destructive elemental analysis method using muon-induced gamma-rays was developed to quantify sub-percent components in bulk materials, including light elements. Pulsed muon beam irradiation experiments for iron reference samples containing varying silicon concentrations were conducted to demonstrate the method. Characteristic muonic X-rays and gamma-rays emitted from unstable nuclides generated by muon nuclear absorption were measured using germanium detectors during the beam irradiation. By measuring gamma-rays derived from silicon, we successfully quantified the silicon at a concentration of 0.36 wt.% in the bulk iron sample, which is difficult to detect using conventional muon elemental analysis based solely on X-rays. [ABSTRACT FROM AUTHOR]
ISSN:02365731
DOI:10.1007/s10967-025-10668-0